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Proceedings. 13th Asian Test Symposium (2004)
Kenting, Taiwan
Nov. 15, 2004 to Nov. 17, 2004
ISBN: 0-7695-2235-1
TABLE OF CONTENTS
Introduction
pp. xxii-xxiv
pp. xxvi
Foreword (PDF)
pp. xi
Invited Talk (Abstract)
pp. xxi
pp. xxii-xxiv
pp. xxvi
Introduction
Foreword (PDF)
pp. xi
pp. xii-xiii
pp. xiv
Tutorials (PDF)
pp. xvi-xviii
Session A1: SOC Testing
null (PDF)
pp. null
Qiang Xu , McMaster University
Nicola Nicolici , McMaster University
pp. 2-7
Yinhe Han , Chinese Academy of Science
Yu Hu , Chinese Academy of Science
Huawei Li , Chinese Academy of Science
Xiaowei Li , Chinese Academy of Science
Anshuman Chandra , Synopsys, Inc.
pp. 8-13
Jianhui Xing , Tsinghua University
Hong Wang , Tsinghua University
Shiyuan Yang , Tsinghua University
pp. 14-19
Aristides Efthymiou , University of Manchester
John Bainbridge , University of Manchester
Douglas A. Edwards , University of Manchester
pp. 20-23
Session B1: Low-Power Testing
null (PDF)
pp. null
Kuen-Jong Lee , National Cheng Kung University
Shaing-Jer Hsu , National Cheng Kung University
Chia-Ming Ho , National Cheng Kung University
pp. 26-31
Zhiqiang You , Nara Institute of Science and Technology
Ken?ichi Yamaguchi , Nara National College of Technology
Michiko Inoue , Nara Institute of Science and Technology
Jacob Savir , New Jersey Institute of Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 32-39
Nan-Cheng Lai , National Chung-Hsing University
Sying-Jyan Wang , National Chung-Hsing University
Yu-Hsuan Fu , National Chung-Hsing University
pp. 40-45
Yoshinobu Higami , Ehime University
Seiji Kajihara , Kyusyu Institute of Technology
Sin-ya Kobayashi , Ehime University
Yuzo Takamatsu , Ehime University
pp. 46-49
Session C1: Analog BIST
null (PDF)
pp. null
Hsin-Wen Ting , National Cheng Kung University
Bin-Da Liu , National Cheng Kung University
Soon-Jyh Chang , National Cheng Kung University
pp. 52-57
Guan-Xun Chen , National Chiao Tung University
Chung-Len Lee , National Chiao Tung University
Jwu-E Chen , National Chung Hua University
pp. 58-61
Hao-Chiao Hong , National Chiao Tung University
Cheng-Wen Wu , National Tsing-Hua University
Kwang-Ting Cheng , University of California at Santa Barbara
pp. 62-67
Soumendu Bhattacharya , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 68-73
Session A2: Advanced DFT
null (PDF)
pp. null
Kohei Miyase , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Sudhakar M. Reddy , University of Iowa
pp. 76-81
Jiann-Chyi Rau , Tamkang University
Ching-Hsiu Lin , Tamkang University
Jun-Yi Chang , Tamkang University
pp. 82-87
Dong Xiang , Tsinghua University
Ming-jing Chen , Tsinghua University
Kai-wei Li , Tsinghua University
Yu-liang Wu , Chinese University of Hong Kong
pp. 88-93
Il-soo Lee , University of Texas at Austin
Yong Min Hur , Dong Seoul College
Tony Ambler , University of Texas at Austin
pp. 94-97
Session B2: Fault Analysis
null (PDF)
pp. null
John P. Hayes , University of Michigan and Albert-Ludwigs-University
Ilia Polian , Albert-Ludwigs-University
Bernd Becker , Albert-Ludwigs-University
pp. 100-105
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 106-111
Masaki Hashizume , University of Tokushima
Daisuke Yoneda , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
Tetsuo Tada , Tokushima Bunri University
Takeshi Koyama , Tokushima Bunri University
Ikuro Morita , University of Tokushima
Takeomi Tamesada , University of Tokushima
pp. 112-117
K. Rothbart , Graz University of Technology
U. Neffe , Graz University of Technology
Ch. Steger , Graz University of Technology
R. Weiss , Graz University of Technology
E. Rieger , Philips Semiconductors
A. Muehlberger , Philips Semiconductors
pp. 118-121
Session C2: Cross-Talk Testing
null (PDF)
pp. null
Melvin A. Breuer , University of Southern California
Sandeep K. Gupta , University of Southern California
Shahin Nazarian , University of Southern California
pp. 124-131
Chung Liang Chen , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
Ming-Shae Wu , National Chiao Tung University
pp. 140-144
Katherine Shu-Min Li , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
Chauchin Su , National Chiao Tung University
Jwu E Chen , National Central University
pp. 145-150
Session A3: Functional Testing
null (PDF)
pp. null
Kazuko Kambe , Nara Institute of Science and Technology
Michiko Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 152-157
Saeed Shamshiri , University of Tehran
Hadi Esmaeilzadeh , University of Tehran
Zainalabedin Navabi , University of Tehran
pp. 158-163
Chin-Lung Chuang , National Central University
Dong-Jung Lu , National Central University
Chien-Nan Jimmy Liu , National Central University
pp. 164-169
Shiyi Xu , Shanghai University
pp. 170-175
Session B3: Logic BIST
null (PDF)
pp. null
Chaowen Yu , University of Iowa
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , Purdue University
pp. 178-183
Santosh Biswas , Indian Institute of Technology at Kharagpur
Siddhartha Mukhopadhyay , Indian Institute of Technology at Kharagpur
Amit Patra , Indian Institute of Technology at Kharagpur
pp. 184-189
Masayuki Arai , Tokyo Metropolitan University
Harunobu Kurokawa , Tokyo Metropolitan University
Kenichi Ichino , Tokyo Metropolitan University
Satoshi Fukumoto , Tokyo Metropolitan University
Kazuhiko Iwasaki , Tokyo Metropolitan University
pp. 190-195
Sukanta Das , Bengal Engineering College
Anirban Kundu , Bengal Engineering College
Biplad K. Sikdar , Bengal Engineering College
pp. 196-201
Session C3: Fault Diagnosis
null (PDF)
pp. null
Wu-Tung Cheng , Mentor Graphics Corporation
Kun-Han Tsai , Mentor Graphics Corporation
Yu Huang , Mentor Graphics Corporation
Nagesh Tamarapalli , Mentor Graphics Corporation
Janusz Rajski , Mentor Graphics Corporation
pp. 204-209
S. Ghosh , University of Cincinnati
K. W. Lai , Broadcom Corporation
W. B. Jone , University of Cincinnati
S. C. Chang , National Tsing-Hua University
pp. 210-215
Hiroshi Takahashi , Ehime University
Yukihiro Yamamoto , Ehime University
Yoshinobu Higami , Ehime University
Yuzo Takamatsu , Ehime University
pp. 216-221
Yuichi Sato , Ehime University
Hiroshi Takahashi , Ehime University
Yoshinobu Higami , Ehime University
Yuzo Takamatsu , Ehime University
pp. 222-227
Session A4: SOC Test Scheduling
null (PDF)
pp. null
Zhiyuan He , Link?ping University
Gert Jervan , Link?ping University
Zebo Peng , Link?ping University
Petru Eles , Link?ping University
pp. 230-235
Yu Hu , Chinese Academy of Science
Yin-He Han , Chinese Academy of Science
Hua-Wei Li , Chinese Academy of Science
Tao Lv , Chinese Academy of Science
Xiao-Wei Li , Chinese Academy of Science
pp. 236-241
Jung-Been Im , Yonsei University
Sunghoon Chun , Yonsei University
Geunbae Kim , Yonsei University
Jin-Ho An , Yonsei University
Sungho Kang , Yonsei University
pp. 242-247
Wei-Lun Wang , Cheng Shiu University
pp. 248-253
Session B4: Memory Testing
null (PDF)
pp. null
Chih-Tsun Huang , National Tsing Hua University
Jen-Chieh Yeh , National Tsing Hua University
Yuan-Yuan Shih , National Tsing Hua University
Rei-Fu Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 260-265
Luigi Dilillo , Université de Montpellier 11/ CNRS
Patrick Girard , Université de Montpellier 11/ CNRS
Serge Pravossoudovitch , Université de Montpellier 11/ CNRS
Arnaud Virazel , Université de Montpellier 11/ CNRS
Simone Borri , Infineon Technologies France
Magali Hage-Hassan , Infineon Technologies France
pp. 266-271
Yi-Ming Sheng , National Tsing Hua University
Ming-Jun Hsiao , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
pp. 272-276
Jin-Fu Li , National Central University
Chao-Da Huang , National Central University
pp. 277-282
Said Hamdioui , Delft University of Technology and Currently with Philips Semiconductor Crolles R&D
John D. Reyes , Intel Corporation
Zaid Al-ars , Delft University of Technology and CatRam Solutions
pp. 283-288
Session C4: Analog Testing
null (PDF)
pp. null
Chih-Haur Huang , National Cheng Kung University
Kuen-Jong Lee , National Cheng Kung University
Soon-Jyh Chang , National Cheng Kung University
pp. 296-301
Ganesh Srinivasan , Georgia Institute of Technology
Shalabh Goyal , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 302-307
C. C. Su , National Chiao Tung University
C. S. Chang , National Chiao Tung University
H. W. Huang , National Chiao Tung University
D. S. Tu , National Chiao Tung University
C. L. Lee , National Chiao Tung University
Jerry C. H. Lin , SynTest Technologies, Inc.
pp. 308-312
Session A5: Testable Design
null (PDF)
pp. null
Mike W. T. Wong , Hong Kong Polytechnic University
Yubin Zhang , Hong Kong Polytechnic University
pp. 314-318
Jin-Fu Li , National Central University
Chih-Chiang Hsu , National Central University
pp. 319-324
D. P. Vasudevan , University of Arkansas
P. K. Lala , University of Arkansas
J. P. Parkerson , University of Arkansas
pp. 325-330
Sukanta Das , Bengal Engineering College
Biplab K. Sikdar , Bengal Engineering College
P Pal Chaudhuri , Flat E4
pp. 331-334
Session B5: Testability Analysis
null (PDF)
pp. null
Guanghui Li , Zhejiang Forestry College and Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 336-341
Debesh Kumar Das , Jadavpur University
Tomoo Inoue , Hiroshima City University
Susanta Chakraborty , Kalyani University
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 342-347
Chia Yee Ooi , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 348-353
Shiy Xu , Shanghai University
E. Edirisuriya , University of Sri Jayewardenepura
pp. 354-357
Session C5: Yield and Reliability
null (PDF)
pp. null
Chin-Long Wey , National Central University
Meng-Yao Liu , National Central University
pp. 360-365
Rei-Fu Huang , National Tsing Hua University
Chin-Lung Su , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Shen-Tien Lin , Industrial Technology Research Institute
Kun-Lun Luo , Industrial Technology Research Institute
Yeong-Jar Chang , Industrial Technology Research Institute
pp. 366-371
Haihua Yan , Auburn University
Adit D. Singh , Auburn University
pp. 372-377
Chin-Yu Huang , National Tsing Hua University
Chu-Ti Lin , National Tsing Hua University
Chuan-Ching Sue , National Cheng Kung University
pp. 378-383
Session A6: Fault Tolerance
null (PDF)
pp. null
Melvin A. Breuer , University of Southern California
pp. 386-393
Chuan-Ching Sue , National Cheng Kung University
Jun-Ying Yeh , National Cheng Kung University
Chin-Yu Huang , National Tsing Hua University
pp. 400-405
Naotake Kamiura , University of Hyogo
Teijiro Isokawa , University of Hyogo
Nobuyuki Matsui , University of Hyogo
pp. 406-411
Session B6: FPGA Testing and Test Reduction
null (PDF)
pp. null
Shyue-Kung Lu , Fu Jen Catholic University
Hung-Chin Wu , Fu Jen Catholic University
Shoei-Jia Yan , Fu Jen Catholic University
Yu-Cheng Tsai , Fu Jen Catholic University
pp. 414-419
Donghoon Han , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 420-425
Hideyuki Ichihara , Hiroshima City University
Masakuni Ochi , Hiroshima City University
Michihiro Shintani , Hiroshima City University
Tomoo Inoue , Hiroshima City University
pp. 426-431
Session C6: Delay Testing
null (PDF)
pp. null
Lei Wang , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 440-447
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 448-453
Ho Fai Ko , McMaster University
Nicola Nicolici , McMaster University
pp. 454-459
Antonio Zenteno , National Institute for Astrophysics Optics and Electronics-INAOE
Victor H. Champac , National Institute for Astrophysics Optics and Electronics-INAOE
Michell Renovell , Laboratoire déInformatique, Robotique et de Microélectronique de Montpellier-LIRMM
Florence Azais , Laboratoire déInformatique, Robotique et de Microélectronique de Montpellier-LIRMM
pp. 460-463
Author Index
Author Index (PDF)
pp. 464-465
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