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2012 IEEE 21st Asian Test Symposium (2003)
Xi?an, China
Nov. 16, 2003 to Nov. 19, 2003
ISBN: 0-7695-1951-2
TABLE OF CONTENTS
Introduction
pp. xix
Reviewers (PDF)
pp. xxi
Plenary Session: Keynote Address
Session 1A: Design for Testability
null (PDF)
pp. null
Hiroyuki Yotsuyanagi , University of Tokushima
Toshimasa Kuchii , Sharp Corporation
Shigeki Nishikawa , Sharp Corporation
Masaki Hashizume , University of Tokushima
Kozo Kinoshita , Osaka Gakuin University
pp. 6
Dong Xiang , Tsinghua University
Ming-Jing Chen , Tsinghua University
Jia-Guang Sun , Tsinghua University
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 12
Xiangdong Xuan , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Adit D. Singh , Auburn University
Namsoo P. Kim , The Boeing Company
Mark T. Chisa , The Boeing Company
pp. 18
Session 1B: Memory Testing 1
null (PDF)
pp. null
Zaid Al-Ars , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
pp. 24
Yuki Yamagata , Tokyo Metropolitan University
Kenichi Ichino , Tokyo Metropolitan University
Masayuki Arai , Tokyo Metropolitan University
Satoshi Fukumoto , Tokyo Metropolitan University
Kazuhiko Iwasaki , Tokyo Metropolitan University
Masayuki Sato , INNOTECH Corp.
Hiroyuki Itabashi , INNOTECH Corp.
Takashi Murai , INNOTECH Corp.
Nobuyuki Otsuka , INNOTECH Corp.
pp. 28
F. Bertuccelli , Aurelia Microelettronica S.p.A
F. Bigongiari , Aurelia Microelettronica S.p.A
A. S. Brogna , Universit? di Pisa
G. Di Natale , Politecnico di Torino
P. Prinetto , Politecnico di Torino
R. Saletti , Universit? di Pisa
pp. 32
Session 1C: Fault Diagnosis 1
null (PDF)
pp. null
Yu-Chiun Lin , National Tsing-Hua University
Shi-Yu Huang , National Tsing-Hua University
pp. 38
Yu Huang , Mentor Graphics Corporation
Wu-Tung Cheng , Mentor Graphics Corporation
Cheng-Ju Hsieh , Faraday Technology Corporation
Huan-Yung Tseng , Faraday Technology Corporation
Alou Huang , Faraday Technology Corporation
Yu-Ting Hung , Faraday Technology Corporation
pp. 44
Session 2A: Delay Testing
null (PDF)
pp. null
Tsuyoshi Iwagaki , Nara Institute of Science and Technology
Satoshi Ohtake , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 58
Masayasu Fukunaga , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Sadami Takeoka , Matsushita Electric Industrial Co., Ltd. Semiconductor Company
pp. 64
Virendra Singh , Nara Institute of Science and Technology and Central Electronics Engineering Research Institute
Michiko Inoue , Nara Institute of Science and Technology
Kewal K Saluja , University of Wisconsin-Madison
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 68
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 72
Session 2B: BIST
null (PDF)
pp. null
Sukanta Das , Bengal Engineering College
Anirban Kundu , Bengal Engineering College
Subhayan Sen , Bengal Engineering College
Biplab K. Sikdar , Bengal Engineering College
P. Pal Chaudhuri , Bengal Engineering College
pp. 78
Md. Rafiqul Islam , University of Dhaka
Hafiz Md Hasan Babu , University of Dhaka
Mohammad Abdur Rahim Mustafa , University of Dhaka
Md. Sumon Shahriar , University of Dhaka
pp. 90
Session 2C: Software Testing 1
null (PDF)
pp. null
Ruilian Zhao , Beijing University of Chemical Technology
Michael R. Lyu , Chinese University of Hong Kong
Yinghua Min , Chinese Academy of Sciences in Beijing
pp. 96
Matthias Beyer , University of Erlangen-Nuremberg
Winfried Dulz , University of Erlangen-Nuremberg
Fenhua Zhen , University of Erlangen-Nuremberg
pp. 102
Yunzhan Gong , Academy of Armored Forces Engineering Beijing
Wanli Xu , Academy of Armored Forces Engineering Beijing
Xiaowei Li , Chinese Academy of Science
pp. 110
Session 3A: Mixed-Signal Testing
null (PDF)
pp. null
Jayasanker Jayabalan , National University of Singapore
Chee Kiang Goh , Infineon Technologies
Ooi Ban Leong , National University of Singapore
Leong Mook Seng , National University of Singapore
Mahadevan K. Iyer , Institute of Microelectronics
Andrew A.O. Tay , National University of Singapore
pp. 116
Kuen-Jong Lee , National Cheng Kung University
Soon-Jyh Chang , National Cheng Kung University
Ruei-Shiuan Tzeng , National Cheng Kung University
pp. 124
Session 3B: Test Compaction 1
null (PDF)
pp. null
Kohei Miyase , Kyusyu Institute of Technology
Seiji Kajihara , Kyusyu Institute of Technology and Kyushu Institute of Technology
pp. 136
Bernd Koenemann , Cadence Design Systems, Inc.
pp. 142
Session 3C: RTL Verification
null (PDF)
pp. null
Liang Zhang , Virginia Tech
Michael Hsiao , Virginia Tech
Indradeep Ghosh , Fujitsu Laboratories of America Inc.
pp. 148
Tun Li , National University of Defense Technology
Yang Guo , National University of Defense Technology
Sikun Li , National University of Defense Technology
pp. 154
Tao Lv , Chinese Academy of Sciences
Jianping Fan , Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 161
Session 4A: Enhanced Delay Testing and ATPG
null (PDF)
pp. null
M. Renovell , Universit? de Montpellier II
J.M. Galli?re , Universit? de Montpellier II
F. Aza? , Universit? de Montpellier II
Y. Bertrand , Universit? de Montpellier II
pp. 168
Arani Sinha , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 174
Huawei Li , Chinese Academy of Sciences
Yue Zhang , Academy of Armored Forces Engineering
Xiaowei Li , Chinese Academy of Sciences
pp. 178
Magdy S. Abadir , Motorola, Inc.
Jing Zeng , Motorola, Inc.
Carol Pyron , Motorola, Inc.
Juhong Zhu , Sun Microsystem
pp. 184
Session 4B: Test Power
null (PDF)
pp. null
S Roy , Kalyani Govt. Engineering College
Biplab K Sikdar , Bengal Engineering College
pp. 190
Yongjun Xu , Chinese Academy of Sciences
Zuying Luo , Tsinghua University
Zhiguo Chen , Chinese Academy of Sciences and University of Electronic Science and Technology of China
Xiaowei Li , Chinese Academy of Sciences
pp. 196
Ozgur Sinanoglu , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 202
Session 4C: Software Testing 2
null (PDF)
pp. null
Masayuki Hirayama , TOSHIBA Corporation
Tetsuya Yamamoto , TOSHIBA Corporation
Osamu Mizuno , Osaka University
Tohru Kikuno , Osaka University
pp. 210
Chang Xu , Chinese Academy of Sciences
Beihong Jin , Chinese Academy of Sciences
pp. 216
Shiyi Xu , Shanghai University
pp. 220
Hui-Qun Zhao , China University Technology
Qin-Xin Gao , Northeastern University
Yuan Gao , Northeastern University
pp. 224
Session 5A: Fault Diagnosis 2
null (PDF)
pp. null
Baris Arslan , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 230
Xiaoqing Wen , SynTest Technologies, Inc.
Hideo Tamamoto , Akita University
Kewal K. Saluja , University of Wisconsin-Madison
Kozo Kinoshita , Osaka Gakuin University
pp. 236
Session 5B: Memory Testing 2
null (PDF)
pp. null
Luigi Dilillo , Universit? de Montpellier II / CNRS
Patrick Girard , Universit? de Montpellier II / CNRS
Serge Pravossoudovitch , Universit? de Montpellier II / CNRS
Arnaud Virazel , Universit? de Montpellier II / CNRS
Simone Borri , Infineon Technologies France
pp. 250
Rei-Fu Huang , National Tsing Hua University
Yung-Fa Chou , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 256
L. Kalyan Kumar , Indian Institute of Technology-Madras
Amol J. Mupid , Indian Institute of Technology-Madras
Aditya S. Ramani , Indian Institute of Technology-Madras
V. Kamakoti , Indian Institute of Technology-Madras
pp. 262
Session 5C: SOC Test
null (PDF)
pp. null
Tsuyoshi Shinogi , Mie University
Yuki Yamada , Mie University
Terumine Hayashi , Mie University
Tomohiro Yoshikawa , Mie University
Shinji Tsuruoka , Mie University
pp. 268
Zhigang Jiang , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 278
Session 6A: DFT Synthesis
null (PDF)
pp. null
Hafizur Rahaman , WB University of Technology
Debesh K. Das , Jadavpur University
Bhargab B. Bhattacharya , Indian Statistical Institute
pp. 284
Junhao Shi , University of Bremen
Goerschwin Fey , University of Bremen
Rolf Drechsler , University of Bremen
pp. 290
Michiko Inoue , Nara Institute of Science and Technology
Kazuhiro Suzuki , Nara Institute of Science and Technology
Hiroyuki Okamoto , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 294
Dong Xiang , Tsinghua University
Shan Gu , Tsinghua University
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 300
Session 6B: Test Scheduling
null (PDF)
pp. null
Erik Larsson , Link?pings Universitet and Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 306
Julien Pouget , Link?pings Universitet
Erik Larsson , Link?pings Universitet
Zebo Peng , Link?pings Universitet
pp. 312
Gert Jervan , Link?ping University
Petru Eles , Link?ping University
Zebo Peng , Link?ping University
Raimund Ubar , Tallinn Technical University
Maksim Jenihhin , Tallinn Technical University
pp. 318
Session 6C: Measurement
null (PDF)
pp. null
Tian Xia , University of Vermont
Jien-Chung Lo , University of Rhode Island
pp. 326
Chin-Cheng Tsai , National Chaio Tung University
Chung-Len Lee , National Chaio Tung University
pp. 332
Jui-Jer Huang , National Taiwan University
Jiun-Lang Huang , National Taiwan University
pp. 336
Junfeng Wang , University of Electric Science and Technology of China
Jianhua Yang , Chinese Academy of Sciences
Gaogang Xie , Chinese Academy of Sciences
Mingtian Zhou , University of Electric Science and Technology of China
Zhongcheng Li , Chinese Academy of Sciences
pp. 340
Session 7A: Test Economics
null (PDF)
pp. null
Baosheng Wang , University of British Columbia
Yong B. Cho , Konkuk University
Sassan Tabatabaei , Vector 12 Corporation
Andr? Ivanov , University of British Columbia
pp. 348
Yuxin Tian , Texas A&M University
Michael R. Grimaila , Texas A&M University
Weiping Shi , Texas A&M University
M. Ray Mercer , Texas A&M University
pp. 354
Jochen Rivoir , Agilent Technologies
pp. 360
Session 7B: Memory Testing 3
null (PDF)
pp. null
Chin-Lung Su , National Tsing Hua University
Rei-Fu Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 366
Said Hamdioui , Delft University of Technology and Intel Corporation
Zaid Al-Ars , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
Mike Rodgers , Intel Corporation
pp. 372
Xiaogang Du , University of Iowa
Sudhakar M. Reddy , University of Iowa
Joseph Rayhawk , Mentor Graphics Corporation
Wu-Tung Cheng , Mentor Graphics Corporation
pp. 378
Mohammad Gh. Mohammad , Kuwait University
Kewal K. Saluja , University of Wisconsin-Madison
pp. 384
Session 7C: Current Test
null (PDF)
pp. null
Masaki Hashizume , University of Tokushima
Teppei Takeda , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
Takeomi Tamesada , University of Tokushima
Yukiya Miura , Tokyo Metropolitan University
Kozo Kinoshita , Osaka Gakuin University
pp. 390
Yinghua Min , Hunan University
Jishun Kuang , Hunan University
Xiaoyan Niu , Hunan University
pp. 396
Jishun Kuang , Hunan University
Yu Wang , Hunan University
Xiaofen Wei , Hunan University
Changnian Zhang , University of Regina
pp. 400
Hiroyuki Michinishi , Okayama University of Science
Tokumi Yokohira , Okayama University
Takuji Okamoto , Okayama University of Science
Toshifumi Kobayashi , Mitsubishi Electric Co.
Tsutomu Hondo , Sharp Takaya Electronics Industry Co.,Ltd.
pp. 406
Session 8A: SOC DFT
null (PDF)
pp. null
Masahide Miyazaki , Semiconductor Technology Academic Research Center
Toshinori Hosokawa , Semiconductor Technology Academic Research Center
Hiroshi Date , Semiconductor Technology Academic Research Center
Michiaki Muraoka , Semiconductor Technology Academic Research Center
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 412
Huaguo Liang , Hefei University of Technology
Cuiyun Jiang , Hefei University of Technology
pp. 418
Md. Saffat Quasem , University of Southern California
Sandeep Gupta , University of Southern California
pp. 424
Session 8B: Test Compaction 2
null (PDF)
pp. null
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 434
Yinhe Han , Chinese Academy of Science
Yongjun Xu , Chinese Academy of Science
Huawei Li , Chinese Academy of Science
Xiaowei Li , Chinese Academy of Science
Anshuman Chandra , Synopsys, Inc.
pp. 440
Hideyuki Ichihara , Hiroshima City University
Michihiro Shintani , Hiroshima City University
Toshihiro Ohara , Hiroshima City University
Tomoo Inoue , Hiroshima City University
pp. 446
Session 8C: Functional Testing/Reliability
null (PDF)
pp. null
Gaocai Wang , Central South University
Jianer Chen , Central South University
Guojun Wang , Central South University
Songqiao Chen , Central South University
pp. 452
Ling Liu , Peking University
Wennan Feng , Peking University
Song Jia , Peking University
Anping Jiang , Peking University
Lijiu Ji , Peking University
pp. 458
P. Gawkowski , Warsaw University of Technology
J. Sosnowski , Warsaw University of Technology
pp. 462
Fabian Vargas , Catholic University - PUCRS
Rubem D. R. Fagundes , Catholic University - PUCRS
Daniel Barros Jr. , Catholic University - PUCRS
Diogo B. Brum , Catholic University - PUCRS
pp. 468
Session 9A: Formal Verification
null (PDF)
pp. null
Guanghui Li , Chinese Academy of Sciences and Zhejiang Forestry College
Ming Shao , Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 474
Ming Shao , Chinese Academy of Sciences
Guanghui Li , Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 478
Zhan Xu , Zhejiang University
Xiaolang Yan , Zhejiang University
Yongjiang Lu , Zhejiang University
Haitong Ge , Zhejiang University
pp. 482
Session 9B: Software Testing 3
null (PDF)
pp. null
Yuan Zhu , Shanghai Normal University
Jianhua Gao , Shanghai Normal University
pp. 488
Da-Hai Jin , Armored Force Engineering Institute
Yun-Zhan Gong , Armored Force Engineering Institute
pp. 492
Jin-Min Yang , Hunan University
Da-Fang Zhang , Hunan University
Xue-Dong Yang , University of Regina
pp. 496
Poster Session
Li Shen , Chinese Academy of Sciences
pp. 502
Ming Zhu , Tsinghua University
Jinian Bian , Tsinghua University
Weimin Wu , Tsinghua University
Hongxi Xue , Tsinghua University
pp. 503
Saeed Safari , Sharif University of Technology
Hadi Esmaeilzadeh , University of Tehran
Amir-Hossein Jahangir , Sharif University of Technology
pp. 505
Yong-sheng Wang , Harbin Institute of Technology
Li-yi Xiao , Harbin Institute of Technology
Ming-yan Yu , Harbin Institute of Technology
Jin-xiang Wang , Harbin Institute of Technology
Yi-zheng Ye , Harbin Institute of Technology
pp. 506
Junichi Hirase , Matsushita Electric Industrial Co., Ltd.
pp. 508
Meng Li , Tongji University
Zhu Xu , Tongji University
pp. 510
Author Index
Author Index (PDF)
pp. 511
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