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12th Asian Test Symposium (ATS'03)
Design Retargetable Platform System for Microprocessor Functional Test
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
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Ling Liu, Wennan Feng, Song Jia, Anping Jiang, Lijiu Ji, "Design Retargetable Platform System for Microprocessor Functional Test," 2012 IEEE 21st Asian Test Symposium, pp. 458, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
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@article{ 10.1109/ATS.2003.1250856,
author = {Ling Liu and Wennan Feng and Song Jia and Anping Jiang and Lijiu Ji},
title = {Design Retargetable Platform System for Microprocessor Functional Test},
journal ={2012 IEEE 21st Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {458},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250856},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 2012 IEEE 21st Asian Test Symposium
TI - Design Retargetable Platform System for Microprocessor Functional Test
SN - 1081-7735
SP
EP
A1 - Ling Liu,
A1 - Wennan Feng,
A1 - Song Jia,
A1 - Anping Jiang,
A1 - Lijiu Ji,
PY - 2003
KW - null
VL - 0
JA - 2012 IEEE 21st Asian Test Symposium
ER -
 
Ling Liu, Peking University
Wennan Feng, Peking University
Song Jia, Peking University
Anping Jiang, Peking University
Lijiu Ji, Peking University
Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG, the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.
Citation:
Ling Liu, Wennan Feng, Song Jia, Anping Jiang, Lijiu Ji, "Design Retargetable Platform System for Microprocessor Functional Test," ats, pp.458, 12th Asian Test Symposium (ATS'03), 2003
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