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12th Asian Test Symposium (ATS'03)
March SL: A Test For All Static Linked Memory Faults
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
| ASCII Text | x | ||
| Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers, "March SL: A Test For All Static Linked Memory Faults," 2012 IEEE 21st Asian Test Symposium, pp. 372, 12th Asian Test Symposium (ATS'03), 2003. | |||
| BibTex | x | ||
| @article{ 10.1109/ATS.2003.1250839, author = {Said Hamdioui and Zaid Al-Ars and Ad J. van de Goor and Mike Rodgers}, title = {March SL: A Test For All Static Linked Memory Faults}, journal ={2012 IEEE 21st Asian Test Symposium}, volume = {0}, year = {2003}, issn = {1081-7735}, pages = {372}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250839}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 21st Asian Test Symposium TI - March SL: A Test For All Static Linked Memory Faults SN - 1081-7735 SP EP A1 - Said Hamdioui, A1 - Zaid Al-Ars, A1 - Ad J. van de Goor, A1 - Mike Rodgers, PY - 2003 KW - Memory testing KW - linked faults KW - functional fault models KW - march tests KW - fault coverage VL - 0 JA - 2012 IEEE 21st Asian Test Symposium ER - | |||
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all possible linked faults. The tests are merged into a single test, March SL, detecting all faults in the linked fault space. The preliminary test results of an experiment done at Intel will be reported; they show that March SL scores high and detects some unique faults.
Index Terms:
Memory testing, linked faults, functional fault models, march tests, fault coverage
Citation:
Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers, "March SL: A Test For All Static Linked Memory Faults," ats, pp.372, 12th Asian Test Symposium (ATS'03), 2003
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