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Eleventh Asian Test Symposium (2002)
Guam, USA
Nov. 20, 2002 to Nov. 20, 2002
ISBN: 0-7695-1825-7
TABLE OF CONTENTS
Section 1A: Test Generation
Irith Pomeranz , Purdue University
Yun Shao , University of Iowa
pp. 1
Ilia Polian , Albert-Ludwigs University
Irith Pomeranz , Purdue University
Bernd Becker , Albert-Ludwigs University
pp. 9
Shiyi Xu , Shanghai University
Jianwen Chen , Shanghai University
pp. 15
Section 1B: On-Line Testing
Junichi Hirase , Matsushita Electric Industrial Co., Ltd.
pp. 21
Chiu-sing Choy , The Chinese University of Hong Kong
Cheong-fat Chan , The Chinese University of Hong Kong
Jing-ling Yang , The University of Hong Kong
pp. 27
Session 1C: Analog and Mixed Signal Testing
Jacob Savir , New Jersey Institute of Technology
pp. 39
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd.
Mana Sona , University of Washington
Hirobumi Musha , Advantest Corporation
pp. 45
Jiun-Lang Huang , National Taiwan University
Kwang-Ting Cheng , University of California, Santa Barbara
Cheng-Wen Wu , National Tsing Hua University
pp. 49
Session 2A: Test Set Compaction
Hiroshi Date , Semiconductor Technology Academic Research Center (STARC)
Toshinori Hosokawa , Semiconductor Technology Academic Research Center (STARC)
pp. 55
Seiji Kajihara , Kyushu Institute of Technology
Kenjiro Taniguchi , Kyushu Institute of Technology
Kohei Miyase , Kyushu Institute of Technology
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 67
Session 2B: Design for Testability
Atlaf Ul Amin , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 73
Takaki Yoshida , Matsushita Electric Industrial Co., Ltd.
Masafumi Watari , Matsushita Electric Industrial Co., Ltd.
pp. 80
Shan Gu , Tsinghua University
Dong Xiang , Tsinghua University
pp. 86
Session 2C: Memory Testing 1
S. Di Carlo , Politecnico di Torino
G. Di Natale , Politecnico di Torino
P. Prinetto , Politecnico di Torino
pp. 92
Zaid Al-Ars , Delft University of Technology
pp. 98
Ming-Jun Hsiao , Nation Tsing-Hua University,
Shu-Rong Lee , Nation Tsing-Hua University
pp. 104
Section 3A: Delay Fault Testing
Kazuki Suzuki , Chiba University
Hideo Ito , Chiba University
pp. 116
Session 3B: Test Synthesis
Tomokazu Miura , Hiroshima City University
Tomoo Inoue , Hiroshima City University
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 128
Yiorgos Makris , Yale University
Alex Orailogolu , University of California, San Diego
pp. 134
P. Zhongliang , South China Normal University
pp. 140
Session 3C: Memory Testing 2
Hong-Sik Kim , Yonsei University
Sungho Kang , Yonsei University
pp. 145
Xuemei Zhao , Harbin Institute of Technology
Yizheng Yu , Harbin Institute of Technology
Chunxu Chen , Harbin Institute of Technology
pp. 151
Swarup Bhunia , Purdue University
Hai Li , Purdue University
Kaushik Roy , Purdue University
pp. 157
Session 4A: Crosstalk Fault Testing
Chung Len Lee , National Chiao Tung University
Chi Peng Chang , National Chiao Tung University
Jwu E. Chen , Chung Hua University
pp. 170
Kazuya Shimizu , Osaka University
Kozo Kinoshita , Ozaka Gakuin University
pp. 176
Kim T. Le , University of Canberra
Marong Phadoongsidhi , University of Wisconsin - Madison
pp. 182
Session 4B: Built-in Self Test 1
Santanu Chattopadhyay , Indian Institute of Technology Guwahati
pp. 188
Emil Gizdarski , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 194
Nan-Cheng Li , National Chung-Hsing University
pp. 200
X. Kavousianos , University of Patras
E. Kalligeros , University of Patras
pp. 206
Session 4C: Fault-Tolerance
Min-Kyu Joo , Hongik University
Jin-Hyung Kim , Hongik University
Yoon-Hwa Choi , Hongik University
pp. 212
Djones Lettnin , Catholic University - PUCRS
Fabian Vargas , Catholic University - PUCRS
Dárcio Prestes , Catholic University - PUCRS
pp. 218
Fabian Vargas , Catholic University - PUCRS
Daniel Barros Jr. , Catholic University - PUCRS
pp. 224
Session 5A: Fault Detection and Diagnosis
Hiroshi Takahashi , Ehime University
Keith J. Keller , University of Wisconsin - Madison
Kewal K. Saluja , University of Wisconsin - Madison
Yuzo Takamatsu , Ehime University
pp. 242
Shi-Yu Huang , National Tsing-Hua University
pp. 248
Session 5B: Built-in Self Test 2
Alexej Dmitriev , University of Potsdam
Krishnendu Chakrabarty , Duke University
pp. 254
Anindyasundar Nandi , Bengal Engineering College
Sukanta Das , Bengal Engineering College
Biplab K. Sikdar , Bengal Engineering College
P. Pal Chaudhuri , Bengal Engineering College
pp. 260
Sheng-Hung Hsieh , National Tsing Hua University
Ming-Jun Hsiao , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
pp. 266
Session 5C: Software Testing
Jin-Cherng Lin , Tatung University
pp. 278
Session 6: Special Session - Test Strategies and Case Studies for SoC in Industries
Masayoshi Yoshimura , Matsushita Electric Industrial Co., Ltd.
Mitsuyasu Ohta , Matsushita Electric Industrial Co., Ltd.
pp. 298
Hiroshi Date , Semiconductor Technology Academic Research Center (STARC)
Toshinori Hosokawa , Semiconductor Technology Academic Research Center (STARC)
Michiaki Muraoka , Semiconductor Technology Academic Research Center (STARC)
pp. 305
Armagan Akar , LogicVision, Inc.
Charlie McDonald , LogicVision, Inc.
Dwayne Burek , LogicVision, Inc.
pp. 311
Rohit Kapur , Synopsys Inc.
T.W. Williams , Synopsys Inc.
pp. 317
Vikram Iyengar , IBM Microelectronics
Krishnendu Chakrabarty , Duke University
Erik Jan Marinissen , Philips Research Laboratories
pp. 320
Session 7A: Test Power Reduction
Xiaowei Li , Chinese Academy of Sciences
Huawei Li , Chinese Academy of Sciences
Shiyuan Yang , TsingHua University
Yinghua Min , Chinese Academy of Sciences
pp. 332
Kuen-Jong Lee , National Cheng-Kung University
Jih-Jeen Chen , National Cheng-Kung University
pp. 338
Session 7B: System-on-Chip Testing 1
Jaehoon Song , Hanyang University
Sungju Park , Hanyang University
pp. 344
Mike W.T. Wong , The Hong Kong Polytechnic University
K.Y. Ko , The Hong Kong Polytechnic University
pp. 350
Jing-Reng Huang , National Tsing Hua University
Yen-Fu Lin , National Tsing Hua University
Chih-Wea Wang , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Chen-Wen Wu , National Tsing Hua University
Youn-Ling Lin , Global UniChip Corp.
pp. 356
Session 7C: Verification and Simulation
Tai-Ying Jiang , National Chiao Tung University
Chien-Nan Jimmy Liu , National Central University
Jing-Yang Jou , National Chiao Tung University
pp. 362
Gianluca Cumani , Politecnico di Torino
Matteo Sonza Reorda , Politecnico di Torino
Fulvio Corno , Politecnico di Torino
pp. 368
Session 8A: Test Systems
Rochit Rajsuman , Advantest America R&D Center
pp. 386
Session 8B: System-on-Chip Testing 2
Klas Arvidsson , Link?pings Universitet
Hideo Fujiwara , Nara Institute of Science and Technology
Erik Larsson , Nara Institute of Science and Technology; Link?pings Universitet
pp. 397
Sudkhkar M. Reddy , University of Iowa
Wu-Tung Cheng , Mentor Graphics Corporation
pp. 405
Jing-Reng Huang , National Tsing Hua University
Huan-Shan Hsu , National Tsing Hua University
Chih-Wea Wang , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Youn-Long Lin , Global UniChip Corp.
pp. 411
Session 8C: Current Testing
Hiroyuki Michinishi , Okayama University of Science
Tokumi Yokohira , Okayama University
Takuji Okamoto , Okayama University of Science
Toshifumi Kobayashi , Mitsubishi Electric Co.
Tsutomu Hondo , Sharp Takaya Electronics Industry Co.,Ltd.
pp. 417
Masaki Hashizume , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
pp. 423
Shambhu Upadhyaya , State University of New York at Buffalo
Padmanabhan Nair , State University of New York at Buffalo
pp. 429
Author Index (PDF)
pp. 435
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