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11th Asian Test Symposium (ATS'02)
Guam, USA
November 18-November 20
ISBN: 0-7695-1825-7
Table of Contents
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Section 1A: Test Generation
Shiyi Xu, Shanghai University
Jianwen Chen, Shanghai University
pp. 15
Section 1B: On-Line Testing
Jing-ling Yang, The University of Hong Kong
Chiu-sing Choy, The Chinese University of Hong Kong
Cheong-fat Chan, The Chinese University of Hong Kong
Kong-pong Pun, The Chinese University of Hong Kong
pp. 27
Session 1C: Analog and Mixed Signal Testing
Jacob Savir, New Jersey Institute of Technology
Zhen Guo, New Jersey Institute of Technology
pp. 39
Masahiro Ishida, Advantest Laboratories, Ltd.
Takahiro J. Yamaguchi, Advantest Laboratories, Ltd.
Mana Sona, University of Washington
Hirobumi Musha, Advantest Corporation
pp. 45
Hao-Chiao Hong, National Tsing Hua University
Jiun-Lang Huang, National Taiwan University
Kwang-Ting Cheng, University of California, Santa Barbara
Cheng-Wen Wu, National Tsing Hua University
pp. 49
Session 2A: Test Set Compaction
Toshinori Hosokawa, Semiconductor Technology Academic Research Center (STARC)
Hiroshi Date, Semiconductor Technology Academic Research Center (STARC)
Michiaki Muraoka, Semiconductor Technology Academic Research Center (STARC)
pp. 55
Seiji Kajihara, Kyushu Institute of Technology
Kenjiro Taniguchi, Kyushu Institute of Technology
Kohei Miyase, Kyushu Institute of Technology
Irith Pomeranz, Purdue University
Sudhakar M. Reddy, University of Iowa
pp. 67
Session 2B: Design for Testability
Atlaf Ul Amin, Nara Institute of Science and Technology
Satoshi Ohtake, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
pp. 73
Takaki Yoshida, Matsushita Electric Industrial Co., Ltd.
Masafumi Watari, Matsushita Electric Industrial Co., Ltd.
pp. 80
Dong Xiang, Tsinghua University
Shan Gu, Tsinghua University
Hideo Fujiwara, Nara Institute of Science and Technology.
pp. 86
Session 2C: Memory Testing 1
A. Benso, Politecnico di Torino
S. Di Carlo, Politecnico di Torino
G. Di Natale, Politecnico di Torino
P. Prinetto, Politecnico di Torino
pp. 92
Shu-Rong Lee, Nation Tsing-Hua University
Ming-Jun Hsiao, Nation Tsing-Hua University,
Tsin-Yuan Chang, Nation Tsing-Hua University,
pp. 104
Section 3A: Delay Fault Testing
Session 3B: Test Synthesis
Tomoo Inoue, Hiroshima City University
Tomokazu Miura, Hiroshima City University
Akio Tamura, Hiroshima City University
Hideo Fujiwara, Nara Institute of Science and Technology
pp. 128
Session 3C: Memory Testing 2
Xuemei Zhao, Harbin Institute of Technology
Yizheng Yu, Harbin Institute of Technology
Chunxu Chen, Harbin Institute of Technology
pp. 151
Session 4A: Crosstalk Fault Testing
Ming Shae Wu, National Chiao Tung University
Chung Len Lee, National Chiao Tung University
Chi Peng Chang, National Chiao Tung University
Jwu E. Chen, Chung Hua University
pp. 170
Marong Phadoongsidhi, University of Wisconsin - Madison
Kim T. Le, University of Canberra
Kewal K. Saluja, University of Wisconsin - Madison
pp. 182
Session 4B: Built-in Self Test 1
Emil Gizdarski, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
pp. 194
Nan-Cheng Li, National Chung-Hsing University
Sying-Jyan Wang, National Chung-Hsing University
pp. 200
Session 4C: Fault-Tolerance
Fabian Vargas, Catholic University - PUCRS
Djones Lettnin, Catholic University - PUCRS
Diogo Brum, Catholic University - PUCRS
Dárcio Prestes, Catholic University - PUCRS
pp. 218
Session 5A: Fault Detection and Diagnosis
Keith J. Keller, University of Wisconsin - Madison
Hiroshi Takahashi, Ehime University
Kim T. Le, University of Canberra
Kewal K. Saluja, University of Wisconsin - Madison
Yuzo Takamatsu, Ehime University
pp. 242
Session 5B: Built-in Self Test 2
Alexej Dmitriev, University of Potsdam
Michael Gössel, University of Potsdam
Krishnendu Chakrabarty, Duke University
pp. 254
Sheng-Hung Hsieh, National Tsing Hua University
Ming-Jun Hsiao, National Tsing Hua University
Tsin-Yuan Chang, National Tsing Hua University
pp. 266
Session 5C: Software Testing
Session 6: Special Session - Test Strategies and Case Studies for SoC in Industries
Masayoshi Yoshimura, Matsushita Electric Industrial Co., Ltd.
Toshinori Hosokawa, Semiconductor Technology Academic Research Center (STARC)
Mitsuyasu Ohta, Matsushita Electric Industrial Co., Ltd.
pp. 298
Hiroshi Date, Semiconductor Technology Academic Research Center (STARC)
Toshinori Hosokawa, Semiconductor Technology Academic Research Center (STARC)
Michiaki Muraoka, Semiconductor Technology Academic Research Center (STARC)
pp. 305
Session 7A: Test Power Reduction
Zuying Lo, TsingHua University
Xiaowei Li, Chinese Academy of Sciences
Huawei Li, Chinese Academy of Sciences
Shiyuan Yang, TsingHua University
Yinghua Min, Chinese Academy of Sciences
pp. 332
Session 7B: System-on-Chip Testing 1
K.Y. Ko, The Hong Kong Polytechnic University
Mike W.T. Wong, The Hong Kong Polytechnic University
Y.S. Lee, The Hong Kong Polytechnic University
pp. 350
Chih-Wea Wang, National Tsing Hua University
Jing-Reng Huang, National Tsing Hua University
Yen-Fu Lin, National Tsing Hua University
Kuo-Liang Chang, National Tsing Hua University
Chih-Tsun Huang, National Tsing Hua University
Chen-Wen Wu, National Tsing Hua University
Youn-Ling Lin, Global UniChip Corp.
pp. 356
Session 7C: Verification and Simulation
Tai-Ying Jiang, National Chiao Tung University
Chien-Nan Jimmy Liu, National Central University
Jing-Yang Jou, National Chiao Tung University
pp. 362
Session 8A: Test Systems
Session 8B: System-on-Chip Testing 2
Erik Larsson, Nara Institute of Science and Technology; Link?pings Universitet
Klas Arvidsson, Link?pings Universitet
Hideo Fujiwara, Nara Institute of Science and Technology
Zebo Peng, Link?pings Universitet
pp. 397
Yu Huang, Mentor Graphics Corporation
Sudkhkar M. Reddy, University of Iowa
Wu-Tung Cheng, Mentor Graphics Corporation
pp. 405
Huan-Shan Hsu, National Tsing Hua University
Jing-Reng Huang, National Tsing Hua University
Kuo-Liang Cheng, National Tsing Hua University
Chih-Wea Wang, National Tsing Hua University
Chih-Tsun Huang, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
Youn-Long Lin, Global UniChip Corp.
pp. 411
Session 8C: Current Testing
Hiroyuki Michinishi, Okayama University of Science
Tokumi Yokohira, Okayama University
Takuji Okamoto, Okayama University of Science
Toshifumi Kobayashi, Mitsubishi Electric Co.
Tsutomu Hondo, Sharp Takaya Electronics Industry Co.,Ltd.
pp. 417
Shambhu Upadhyaya, State University of New York at Buffalo
Jae Min Lee, State University of New York at Buffalo
Padmanabhan Nair, State University of New York at Buffalo
pp. 429
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