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Tenth Asian Test Symposium (2001)
Kyoto, Japan
Nov. 19, 2001 to Nov. 21, 2001
ISBN: 0-7695-1378-6
TABLE OF CONTENTS
pp. xxi
Reviewers (PDF)
pp. xxiii
Plenary Session: Keynote Address
Janusz Rajski , Mentor Graphics Corporation, USA
pp. 3
Session 1A: Design for Testability - Chair: Ermenfried Prochaska, Fachhochschule Heilbronn, Germany
Md. Altaf-Ul-Amin , Nara Institute of Science and Technology
Satoshi Ohtake , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 11
Dong Xiang , Tsinghua University
Yi Xu , Tsinghua University
pp. 17
Hiroyuki Yotsuyanagi , University of Tokushima
Shinsuke Hata , University of Tokushima
Masaki Hashizume , University of Tokushima
Takeomi Tamesada , University of Tokushima
pp. 23
Session 1B: Fault Modeling for Memories - Chair: Kazuhiko Iwasaki, Tokyo Metropolitan University, Japan
Matthias Klaus , ProMOS Technologies
Ad J. van de Goor , Delft University of Technology
pp. 31
Said Hamdioui , Intel Corporation and Delft University of Technology
Ad J. van de Goor , Delft University of Technology
David Eastwick , Intel Corporation
Mike Rodgers , Intel Corporation
pp. 37
Zaid Al-Ars , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
Jens Braun , Infineon Technologies AG
Detlev Richter , Infineon Technologies AG
pp. 43
Session 1C: Diagnosis Session - Chair: Shiyi Xu, Shanghai University, China
Irith Pomeranz , Purdue University
pp. 51
M. Gössel , University of Potsdam
V. Ocheretnij , University of Potsdam
S. Chakrabarty , Kalyani University
pp. 57
Hiroshi Takahashi , Ehime University
Marong Phadoongsidhi , University of Wisconsin -Madison
Yoshinobu Higami , Ehime University
Kewal K. Saluja , University of Wisconsin -Madison
Yuzo Takamatsu , Ehime University
pp. 63
Session 2A: ATPG - Chair: Christian Landrault, LIRMM, France
Yoshinobu Higami , Ehime University
Naoko Takahashi , Ehime University
Yuzo Takamatsu , Ehime University
pp. 71
Tsuyoshi Shinogi , Mie University
Tomokazu Kanbayashi , Mie University
Tomohiro Yoshikawa , Mie University
Shinji Tsuruoka , Mie University
Terumine Hayashi , Mie University
pp. 76
Session 2B: Embedded Memory Test - Chair: Yervant Zorian, Logic Vision, Inc., USA
Kuo-Liang Cheng , National Tsing Hua University
Chia-Ming Hsueh , National Tsing Hua University
Jing-Reng Huang , National Tsing Hua University
Jen-Chieh Yeh , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 91
D. Appello , STMicroelectronics
F. Corno , Politecnico di Torino
M. Giovinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 97
Chih-Wea Wang , National Tsing Hua University
Ruey-Shing Tzeng , National Tsing Hua University
Chi-Feng Wu , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Shi-Yu Huang , National Tsing Hua University
Shyh-Horng Lin , SynTest Technologies,Inc.
Hsin-Po Wang , SynTest Technologies,Inc.
pp. 103
Session 2C: IDDQ and Diagnosis Test - Chair: Hiroshi Yokoyama, Akita University, Japan
Teppei Takeda , The University of Tokushima
Masaki Hashizume , The University of Tokushima
Masahiro Ichimiya , The University of Tokushima
Hiroyuki Yotsuyanagi , The University of Tokushima
Yukiya Miura , Tokyo Metropolitan University
Kozo Kinoshita , Osaka Gakuin University
pp. 111
Masaki Hashizume , University of Tokushima
Masahiro Ichimiya , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
Takeomi Tamesada , University of Tokushima
pp. 117
Iwao Yamazaki , Hitachi, Ltd.
Hiroki Yamanaka , Hitachi, Ltd.
Toshio Ikeda , Hitachi, Ltd.
Masahiro Takakura , Hitachi Engineering Co., Ltd.
Yasuo Sato , Hitachi, Ltd.
pp. 123
Session 3A: Test Compaction - Chair: Toshinori Hosokawa, Semiconductor Technology Academic Research Center, Japan
Kwame Osei Boateng , Fujitsu Labs. Ltd.
Hideaki Konishi , Fujitsu Co.
Tsuneo Nakata , Fujitsu Labs. Ltd.
pp. 137
Hideyuki Ichihara , Hiroshima City University
Atsuhiro Ogawa , Hiroshima City University
Tomoo Inoue , Hiroshima City University
Akio Tamura , Hiroshima City University
pp. 143
Session 3B: Pattern Generation for Memory Test - Chair: Tetsuo Tada, Mitsubishi Electric Corporation, Japan
Mill-Jer Wang , Vanguard International Semiconductor Corporation
R.-L. Jiang , Vanguard International Semiconductor Corporation
J.-W. Hsia , Vanguard International Semiconductor Corporation
Chih-Hu Wang , Chung-Hua University
Jwu E. Chen , Chung-Hua University
pp. 151
Alfredo Benso , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Giorgio Di Natale , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
pp. 157
S. Demidenko , Massey University
A. van de Goor , Delft University of Technology
S. Henderson , Massey University
P. Knoppers , Delft University of Technology
pp. 164
Session 3C: Virtual Tester and Beam Testing - Chair: Koji Nakamae, Osaka University, Japan
Junichi Hirase , Matsushita Electric Industrial CoO., Ltd.
pp. 173
Norio Kuji , NTT Electronics Co. and NTT Telecommunications Energy Laboratories
Takako Ishihara , NTT Electronics Co. and NTT Telecommunications Energy Laboratories
pp. 179
Jeffrey A. Block , Schlumberger SABER
William K. Lo , Schlumberger Probe Systems
Chris Shaw , Schlumberger Probe Systems
pp. 185
Session 4A: SoC Test Access Mechanism - Chair: Hiroshi Date, ABEL Systems Inc., Japan
Session 4B: RTL ATPG - Chair: Jacob A. Abraham, University of Texas at Austin, USA
Huawei Li , Chinese Academy of Sciences
Yinghua Min , Chinese Academy of Sciences
Zhongcheng Li , Chinese Academy of Sciences
pp. 213
Zhigang Yin , Chinese Academy of Sciences
Yinghua Min , Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 219
Fulvio Corno , Politecnico di Torino
Gianluca Cumani , Politecnico di Torino
Matteo Sonza Reorda , Politecnico di Torino
Giovanni Squillero , Politecnico di Torino
pp. 225
Session 4C: Delay Test - Chair: Jacob Savir, New Jersey Institute of Technology, USA
Yun Shao , University of Iowa
Sudhakar M. Reddy , University of Iowa
Seiji Kajihara , Kyushu Institute of Technology
Irith Pomeranz , Purdue University
pp. 233
Kee Sup Kim , Intel Corporation
Rathish Jayabharathi , Intel Corporation
Craig Carstens , Intel Corporation
pp. 239
Michinobu Nakao , Hitachi Ltd.
Yoshikazu Kiyoshige , Hitachi Ltd.
Kazumi Hatayama , Hitachi Ltd.
Yasu Sato , Hitachi Ltd.
Takaharu Nagumo , Hitachi Ltd.
pp. 244
Session 5A: SoC Test Scheduling - Chair: Prab Varma, Veritable Inc., USA
Y. Bonhomme , Universit? Montpellier II /CNRS
P. Girard , Universit? Montpellier II /CNRS
L. Guiller , Universit? Montpellier II /CNRS
C. Landrault , Universit? Montpellier II /CNRS
S. Pravossoudovitch , Universit? Montpellier II /CNRS
pp. 253
Erik Larsson , Link?pings University
Zebo Peng , Link?pings University
pp. 259
Yu Huang , University of Iowa
Wu-Tung Cheng , Mentor Graphics Corporation
Chien-Chung Tsai , Mentor Graphics Corporation
Nilanjan Mukherjee , Mentor Graphics Corporation
Omer Samman , Mentor Graphics Corporation
Yahya Zaidan , Mentor Graphics Corporation
Sudhakar M. Reddy , University of Iowa
pp. 265
Session 5B: FSM Test - Chair: Hiroshi Takahashi, Ehime University, Japan
P. K. Lala , University of Arkansas
A. Walker , North Carolina A&T State University
pp. 273
Samrat Goswami , Indian Institute of Technology at Kharagpur
Anupam Chanda , Indian Institute of Technology at Kharagpur
D. Roy Choudhury , Indian Institute of Technology at Kharagpur
pp. 279
Biplab K Sikdar , Bengal Engineering College
Samir Roy , Kalyani Government Engineering College
Debesh K Das , Jadavpur University
pp. 285
Session 5C: Online Testing and Fault Injection line - Chair: Masahiro Tsunoyama, Niigata Institute of Technology, Japan
Emmanuel Simeu , TIMA Laboratory
Ahmad Abdelhay , TIMA Laboratory
Mohammad A. Naal , TIMA Laboratory
pp. 293
Alfredo Benso , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Giorgio Di Natale , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
Luca Tagliaferri , Politecnico di Torino
pp. 299
P. Civera , Politecnico di Torino
L. Macchiarulo , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 304
Session 6A: Advances in BIST - Chair: Kazuhiko Iijima, Logic Vision, Inc., Japan
Ken-ichi Yamaguchi , Nara Institute of Science and Technology
Hiroki Wada , Nara Institute of Science and Technology
Toshimitsu Masuzawa , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 313
Sobeeh Almukhaizim , University of California at San Diego
Peter Petrov , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 319
Bernd Koenemann , IBM Microelectronics
Carl Barnhart , IBM Microelectronics
Brion Keller , IBM Microelectronics
Tom Snethen , IBM Microelectronics
Owen Farnsworth , IBM Microelectronics
Donald Wheater , IBM Microelectronics
pp. 325
Session 6B: Analog Test - Chair: Yasuo Furukawa, Advantest Corporation, Japan
Zhen Guo , New Jersey Institute of Technology
Xi Min Zhang , New Jersey Institute of Technology
Jacob Savir , New Jersey Institute of Technology
Yun-Qing Shi , New Jersey Institute of Technology
pp. 338
Achintya Halder , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 344
Session 6C: Fault Tolerance - Chair: Hideo Ito, Chiba University, Japan
Junichi Hirase , Matsushita Electric Industrial Co., Ltd.
pp. 353
Naotake Kamiura , Himeji Institute of Technology
Yasuyuki Taniguchi , Sharp Corporation
Teijiro Isokawa , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
pp. 359
V. Ocheretnij , University of Potsdam
E. S. Sogomonya , University of Potsdam
M. Gössel , University of Potsdam
pp. 365
Session 7A: Various Ideas for BIST - Chair: Tokumi Yokohira, Okayama University, Japan
Ismet Bayraktaroglu , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 373
Kenichi Ichino , Tokyo Metropolitan University
Takeshi Asakawa , Tokyo Metropolitan University
Satoshi Fukumoto , Tokyo Metropolitan University
Kazuhiko Iwasaki , Tokyo Metropolitan University
Seiji Kajihara , Kyushu Institute of Technology
pp. 379
Biplab K Sikdar , Bengal Engineering College
Niloy Ganguly , IISWBM
Aniket Karmakar , Bengal Engineering College
Subha Sankar Chowdhury , Bengal Engineering College
P. Pal Chaudhuri , Bengal Engineering College
pp. 385
Dongkyu Youn , Hanyang University
Taehyung Kim , Hanyang University
Sungju Park , Hanyang University
pp. 391
Hamed Farshbaf , University of Tehran
Mina Zolfy , University of Tehran
Shahrzad Mirkhani , University of Tehran
Zainalabedin Navabi , University of Tehran
pp. 396
Session 7B: Analog/Mixed Signal Test - Chair: Michel Renovell, LIRMM, France
Biranchinath Sahu , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 405
Alfred V. Gomes , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 411
A. Lechner , Lancaster University
A. Richardson , Lancaster University
B. Hermes , Philips Semiconductors
pp. 417
Jeng-Horng Tsai , National Tsing Hua University
Ming-Jun Hsiao , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
pp. 423
Session 7C: Verification - Chair: Kiyoharu Hamaguchi, Osaka University, Japan
Poster Session 1: DFT Application to Real Chips
Y. Sato , Hitachi, Ltd.
M. Sato , Hitachi, Ltd.
K. Tsutsumida , Hitachi, Ltd.
T. Ikeya , Hitachi, Ltd.
M. Kawashima , Hitachi, Ltd.
pp. 457
Tx7901 Dft (PDF)
Tetsuo Kamada , Toshiba Corporation Semiconductor Company
pp. 458
Toshinobu Ono , NEC Corporation
Akira Kozawa , NEC Software Hokuriku, LTD.
Takashi Kimura , NEC Software Hokuriku, LTD.
Yoshihiro Konno , NEC Corporation
Koji Saga , NEC Corporation
pp. 459
Hisayoshi Hanai , Mitsubishi Electric Corporation
Shinji Yamada , Mitsubishi Electric Corporation
Hisaya Mori , Mitsubishi Electric Corporation
Eisaku Yamashita , Mitsubishi Electric Corporation
Teruhiko Funakura , Mitsubishi Electric Corporation
pp. 460
M. Suzuki , Fujitsu Ltd.
R. Shimizu , Fujitsu Ltd.
N. Naka , Fujitsu Ltd.
K. Nakamura , Fujitsu Ltd.
pp. 461
Tetsuji Kishi , Matsushita Electric Industrial Co,. Ltd.
Mitsuyasu Ohta , Matsushita Electric Industrial Co,. Ltd.
Takashi Taniguchi , Matsushita Electric Industrial Co,. Ltd.
Hiroshi Kadota , Matsushita Electric Industrial Co,. Ltd.
pp. 462
Xiaoqing Wen , SynTest Technologies, Inc.
Hsin-Po Wang , SynTest Technologies, Inc.
pp. 463
Poster Session 2: Practical Ideas from Universities
Shiyi Xu , Shanghai University
pp. 468
Tsung-Chu Huang , National Cheng Kung University
Kuen-Jong Lee , National Cheng Kung University
pp. 470
Author Index (PDF)
pp. 471
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