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10th Asian Test Symposium (ATS'01)
On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks
Kyoto, Japan
November 19-November 21
ISBN: 0-7695-1378-6
| ASCII Text | x | ||
| Zhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi, "On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks," 2012 IEEE 21st Asian Test Symposium, pp. 338, 10th Asian Test Symposium (ATS'01), 2001. | |||
| BibTex | x | ||
| @article{ 10.1109/ATS.2001.990306, author = {Zhen Guo and Xi Min Zhang and Jacob Savir and Yun-Qing Shi}, title = {On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks}, journal ={2012 IEEE 21st Asian Test Symposium}, volume = {0}, year = {2001}, isbn = {0-7695-1378-6}, pages = {338}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990306}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 21st Asian Test Symposium TI - On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks SN - 0-7695-1378-6 SP EP A1 - Zhen Guo, A1 - Xi Min Zhang, A1 - Jacob Savir, A1 - Yun-Qing Shi, PY - 2001 KW - Neural Network KW - Fault Detection KW - Charecterization KW - System on a Chip VL - 0 JA - 2012 IEEE 21st Asian Test Symposium ER - | |||
Testing and characterization of analog circuits is a very important task in the VLSI manufacturing process. However, no efficient methodology exists on how to effectively model and characterize the various faults, and even how to dectect their existence. Neural networks have been successfully applied to various pattern recognition problems. In this paper, the amplitude and temporal characteristics of the good circuit response are used to train a neural network, so that it is able to distinguish between different faulty circuit responses. A Time-Delay Neural Network (TDNN) is proposed as a possible vehicle for performing the test and diagnosis.
Index Terms:
Neural Network, Fault Detection, Charecterization, System on a Chip
Citation:
Zhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi, "On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks," ats, pp.338, 10th Asian Test Symposium (ATS'01), 2001
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