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Ninth Asian Test Symposium (ATS'00)
Effective parallel processing techniques for the generation of test data for a logic built-in self test system
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
| ASCII Text | x | ||
| P. Chang, B. Keller, S. Paliwal, "Effective parallel processing techniques for the generation of test data for a logic built-in self test system," 2012 IEEE 21st Asian Test Symposium, pp. 374, Ninth Asian Test Symposium (ATS'00), 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/ATS.2000.893652, author = {P. Chang and B. Keller and S. Paliwal}, title = {Effective parallel processing techniques for the generation of test data for a logic built-in self test system}, journal ={2012 IEEE 21st Asian Test Symposium}, volume = {0}, year = {2000}, issn = {1081-7735}, pages = {374}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893652}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 21st Asian Test Symposium TI - Effective parallel processing techniques for the generation of test data for a logic built-in self test system SN - 1081-7735 SP EP A1 - P. Chang, A1 - B. Keller, A1 - S. Paliwal, PY - 2000 KW - built-in self test; logic testing; microprocessor chips; integrated circuit testing; parallel processing; logic simulation; automatic test pattern generation; logic partitioning; parallel processing; test data; logic built-in self test; complex processor; simulation time; logic simulation; random stimulus generation; signature computation; partitioning; Pseudo-Random Pattern Generators; serial compression; response data; serial pattern dependency; parallel simulation; post processing; signatures VL - 0 JA - 2012 IEEE 21st Asian Test Symposium ER - | |||
Logic Built-in Self rest (LBIST) is a test methodology adopted by some companies to test their complex processor designs. It can involve a very high volume of simulation, perhaps up to one to two million patterns. For large designs, the simulation time (which includes logic simulation, random stimulus generation and signature computations) can be enormous. Parallel processing provides a relief for this long simulation time. This paper describes a technique to efficiently partition patterns among different processors. These patterns are derived from on-product Pseudo-Random Pattern Generators (PRPGs) and the signature is a serial compression of the response data from all of the patterns. Both the PRPG and signature calculation have a serial pattern dependency, which normally would prohibit parallel simulation of the patterns. We show how to quickly advance a PRPG state to jump ahead to any specific pattern's starting state and an innovative post processing technique to compute correct signatures from initially incorrect ones computed in parallel among different processes. The results demonstrate that the overhead to correct the signatures is small and the parallel speed up is very effective.
Index Terms:
built-in self test; logic testing; microprocessor chips; integrated circuit testing; parallel processing; logic simulation; automatic test pattern generation; logic partitioning; parallel processing; test data; logic built-in self test; complex processor; simulation time; logic simulation; random stimulus generation; signature computation; partitioning; Pseudo-Random Pattern Generators; serial compression; response data; serial pattern dependency; parallel simulation; post processing; signatures
Citation:
P. Chang, B. Keller, S. Paliwal, "Effective parallel processing techniques for the generation of test data for a logic built-in self test system," ats, pp.374, Ninth Asian Test Symposium (ATS'00), 2000
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