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Ninth Asian Test Symposium (ATS'00)
Spirit: satisfiability problem implementation for redundancy identification and test generation
Taipei, Taiwan
December 04-December 06
ISBN: 0-7695-0887-1
ASCII Text
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E. Gizdarski, H. Fujiwara, "Spirit: satisfiability problem implementation for redundancy identification and test generation," 2012 IEEE 21st Asian Test Symposium, pp. 171, Ninth Asian Test Symposium (ATS'00), 2000.
 
 
BibTex
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@article{ 10.1109/ATS.2000.893621,
author = {E. Gizdarski and H. Fujiwara},
title = {Spirit: satisfiability problem implementation for redundancy identification and test generation},
journal ={2012 IEEE 21st Asian Test Symposium},
volume = {0},
year = {2000},
issn = {1081-7735},
pages = {171},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893621},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - 2012 IEEE 21st Asian Test Symposium
TI - Spirit: satisfiability problem implementation for redundancy identification and test generation
SN - 1081-7735
SP
EP
A1 - E. Gizdarski,
A1 - H. Fujiwara,
PY - 2000
KW - computability; combinational circuits; automatic test pattern generation; logic testing; test pattern generation; Boolean satisfiability method; combinational circuits; SPIRIT; ATPG system; test sets
VL - 0
JA - 2012 IEEE 21st Asian Test Symposium
ER -
 
E. Gizdarski, Dept. of Comput. Syst., Rousse Univ., Rousse, Bulgaria
H. Fujiwara, Dept. of Comput. Syst., Rousse Univ., Rousse, Bulgaria
In this paper an efficient test pattern generation (TPG) algorithm for combinational circuits based on the Boolean satisfiability method (SAT) is presented. We examine some not so popular approaches as a single cone processing, single path oriented propagation and backward justification. We give a new definition for SAT-based test generation and present duality of learning phenomenon. The resultant ATPG system, called SPIRIT, combines the flexibility of SAT-based TPG algorithms with the efficiency of structural TPG algorithms. Experimental results demonstrate the efficiency and robustness of the proposed TPG algorithm. Without fault simulation, SPIRIT is able to generate complete test sets for the ISCAS'85 benchmark circuits and full scan version of the ISCAS'89 benchmark circuits within 3 minutes on a 450 MHz Pentium-III PC.
Index Terms:
computability; combinational circuits; automatic test pattern generation; logic testing; test pattern generation; Boolean satisfiability method; combinational circuits; SPIRIT; ATPG system; test sets
Citation:
E. Gizdarski, H. Fujiwara, "Spirit: satisfiability problem implementation for redundancy identification and test generation," ats, pp.171, Ninth Asian Test Symposium (ATS'00), 2000
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