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2012 IEEE 21st Asian Test Symposium (1999)
Shanghai, China
Nov. 16, 1999 to Nov. 18, 1999
ISBN: 0-7695-0315-2
TABLE OF CONTENTS
Reviewers (PDF)
pp. xix
Plenary Session: Keynote Address
Session 1A: ATPG Related Approaches I, Chair: Christian Landrault, LIRMM, France
Satoshi Ohtake , Nara Institute of Science and Technology
Michiko Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 5
Junichi Hirase , Matsushita Electric Industrial Co., Ltd
Shinichi Yoshimura , Matsushita Electric Industrial Co., Ltd
Tomohisa Sczaki , Matsushita Electric Industrial Co., Ltd
pp. 13
Seiji Kajihara , Kyushu Institute of Technology
Atsushi Murakami , Kyushu Institute of Technology
Tomohisa Kaneko , Kyushu Institute of Technology
pp. 20
Masaki Hashizume , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
Takeomi Tamesada , University of Tokushima
pp. 25
Session 1B: Delay Fault & Memory Test, Chair: Xinghao Chen, IBM, USA
A.J. van de Goor , Delft University of Technology
J.E. Simonse , Delft University of Technology
pp. 33
Irith Pomeranz , University of Iowa
Sudhakar M. Reddy , University of Iowa
pp. 41
G. Sidiropoulos , University of Patras and Computer Technology
H.T. Vergos , University of Patras and Computer Technology
D. Nikolos , University of Patras and Computer Technology
pp. 47
Said Hamdioui , Intel Corporation and Delft University of Technology
A. J. van de Goor , Delft University of Technology
pp. 53
Session 2A: ATPG Related Approaches II, Chair: Sreejit Chakravarty, Intel, USA
Zhide Zeng , National University of Defense Technology
Jihua Chen , National University of Defense Technology
Hefeng Cao , National University of Defense Technology
pp. 70
Session 2B: BIST Related Approaches, Chair: Yuejian Wu, Nortel Semiconductor, Canada
P. Girard , Universit? Montpellier II
L. Guiller , Universit? Montpellier II
C. Landrault , Universit? Montpellier II
S. Pravossoudovitch , Universit? Montpellier II
pp. 89
W. Feng , Lucent Technologies
W.K. Huang , Fudan University
F.J. Meyer , Northeastern University
F. Lombardi , Northeastern University
pp. 95
Serge Demidenko , Massey University
Kenneth Lever , Massey University
pp. 113
Session 3A: Test Generation, Diagnosis, & Verification, Chair: Hiromi Hiraishi, Kyoto Sangyo University, Japan
Arabi Keshk , Osaka University
Kozo Kinoshita , Osaka University
Yukiya Miura , Tokyo Metropolitan University
pp. 121
Chanyutt Arjhan , Florida Institute of Technology
Raghvendra G. Deshmukh , Florida Institute of Technology
pp. 127
Zhide Zeng , National University of Defense Technology
Jihua Chen , National University of Defense Technology
Pengxia Liu , National University of Defense Technology
pp. 133
Session 3B: IDDQ Test, Chair: Dajin Wang, University of Montclair, USA
Yoshinobu Higami , Ehime University
Yuzo Takamatsu , Ehime University
Kewal K. Saluja , University of Wisconsin
Kozo Kinoshita , Osaka University
pp. 141
Hideyuki Ichihara , Osaka University
Kozo Kinoshita , Osaka University
Seiji Kajihara , Kyushu Institute of Technology
pp. 147
Junichi Hirase , Matsushita Electric Industrial Co., Ltd
Naoki Shindou , Matsushita Electric Industrial Co., Ltd
Kouji Akahori , Matsushita Electronics Industrial Co., Ltd
pp. 153
Arabi Keshk , Osaka University
Kozo Kinoshita , Osaka University
Yukiya Miura , Tokyo Metropolitan University
pp. 158
Session 4A: Sequential Circuit Test, Chair: Serge Demidenko, Massey University, New Zealand
Li Shen , Chinese Academy of Sciences
pp. 179
Mario Konijnenburg , Philips Research Laboratories
Hans Van der Linden , Delft University of Technology
Ad van de Goor , Delft University of Technology
pp. 185
Toshinori Hosokawa , Matsushita Electric Industrial Co., Ltd.
Toshihiro Hiraoka , Matsushita Electric Industrial Co., Ltd.
Tomoo Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 192
Session 4B: Fault-Tolerant & Diagnosis, Chair: Xiaozhong Yang, Harbin Institute of Technology, China
Yasuyuki Taniguchi , Himeji Institute of Technology
Naotake Kamiura , Himeji Institute of Technology
Yutaka Hata , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
pp. 203
Tao Zhang , Tsinghua University
Dongcheng Hu , Tsinghua University
Shiyuan Yang , Tsinghua University
pp. 209
Jianhua Gao , China Textile University
Shihuang Shao , China Textile University
pp. 214
Chenglian Peng , Fudan University
Baifeng Wu , Fudan University
Xiaoguang Sun , Fudan University
pp. 218
Session 5A: Analog Circuits Test, Chair: Chung-Len Lee, National Chiao Tung University, Taiwan
Abdelhakim Khouas , University of Pierre et Marie Curie
Mohamed Dessouky , University of Pierre et Marie Curie
Anne Derieux , University of Pierre et Marie Curie
pp. 227
Chauchin Su , National Central University
Yue-Tsang Chen , National Central University
Chung-Len Lee , National Chiao Tung University
pp. 233
Sam Huynh , University of Washington
Jinyan Zhang , University of Washington
Seongwon Kim , University of Washington
Giri Devarayanadurg , University of Washington
Mani Soma , University of Washington
pp. 239
Session 5B: (Special Session) Railway Signaling Software Testing, Chair: Yinghua Min, ICT of China, China
Zhongwei Xu , Shanghai Tiedao University
Fangmei Wu , Shanghai Tiedao University
pp. 251
Haiying Tu , Shanghai Tiedao University
Fangmei Wu , Shanghai Tiedao University
pp. 256
Session 6A: DFT, Chair: Kiyoshi Furuya, Chuo University, Japan
Debesh Kumar Das , Jadavpur University
Satoshi Ohtake , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 263
Abhijit Jas , University of Texas at Austin
Kartik Mohanram , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 275
Session 6B: Software Test & Verification, Chair: Kuen-Jong Lee, National Cheng Kung University, Taiwan
Youngchul Kim , Illinois Institute of Technology
C. Robert Carlson , Illinois Institute of Technology
pp. 283
Huaikou Miao , Shanghai University
Xiaolei Gao , Shanghai University
Ling Liu , Shanghai University
pp. 289
Ian Ho , Tatung Institute of Technology
Jin-Cherng Lin , Tatung Institute of Technology
pp. 295
Shyue-Kung Lu , Fu Jen Catholic University
Tsung-Ying Lee , Fu Jen Catholic University
Cheng-Wen Wu , National Tsing Hua University
pp. 301
Session 7A: Scan & Boundary Scan, Chair: T.W. Williams, Synopsys, Inc.
Tomoya Takasaki , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
Tomoo Inoue , Hiroshima City University
pp. 309
Tsung-Chu Huang , National Cheng-Kung University
Kuen-Jong Lee , National Cheng-Kung University
pp. 315
Xinghao Chen , IBM Corporation
Tom Snethen , IBM Corporation
Joe Swenton , IBM Corporation
Ron Walther , IBM Corporation
pp. 321
Zulan Huang , Harbin Institute of Technology
Yizheng Ye , Harbin Institute of Technology
Zhigang Mao , Harbin Institute of Technology
pp. 327
Session 7B: (Special Session) Beam Testing in Japan, Chair: Hiromu Fujioka, Osaka University, Japan
Katsuyoshi Miura , Osaka University
Koji Nakamae , Osaka University
Hiromu Fujioka , Osaka University
pp. 335
Reisuke Shimoda , Matsushita Electric Industrial Co., Ltd.
Takaki Yoshida , Matsushita Electric Industrial Co., Ltd.
Masafumi Watari , Matsushita Electric Industrial Co., Ltd.
Yasuhiro Toyota , Matsushita Electric Industrial Co., Ltd.
Kiyokazu Nishi , Matsushita Electric Industrial Co., Ltd.
Akira Motohara , Matsushita Electric Industrial Co., Ltd.
pp. 347
Session 8A: FPGA Test, Chair: Hideo Fujiwara, Nara Institute of Science & Technology, Japan
Yinlei Yu , Fudan University
Jian Xu , Fudan University
Wei Kang Huang , Fudan University
Fabrizio Lombardi , Northeastern University
pp. 357
Abderrahim Doumar , Chiba University
Hideo Ito , Chiba University
pp. 369
Lan Zhao , Lucent Technologies
D.M.H. Walker , Texas A&M University
Fabrizio Lombardi , Northeastern University
pp. 375
Session 8B: (Special Session) Beam Testing in Japan, Chair: Kiyoshi Nikawa, NEC, Japan
Yoichi Ose , Hitachi, Ltd., Hitachinaka, Japan
Makoto Ezumi , Hitachi, Ltd., Hitachinaka, Japan
Hideo Todokoro , Hitachi, Ltd., Hitachinaka, Japan
pp. 383
Kiyoshi Nikawa , NEC Corporation
Shoji Inoue , T.D.I. Co., Ltd.,
Kazuyuki Morimoto , Naito Densei Kogyo, Co., Ltd.
Shinya Sone , Naito Densei Kogyo, Co., Ltd.
pp. 394
Panel Session 1
Panel Session 2
Author Index (PDF)
pp. 405
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