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Eighth Asian Test Symposium (ATS'99)
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method
Shanghai, China
November 16-November 18
ISBN: 0-7695-0315-2
| ASCII Text | x | ||
| Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone, "Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method," 2012 IEEE 21st Asian Test Symposium, pp. 394, Eighth Asian Test Symposium (ATS'99), 1999. | |||
| BibTex | x | ||
| @article{ 10.1109/ATS.1999.810781, author = {Kiyoshi Nikawa and Shoji Inoue and Kazuyuki Morimoto and Shinya Sone}, title = {Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method}, journal ={2012 IEEE 21st Asian Test Symposium}, volume = {0}, year = {1999}, issn = {1081-7735}, pages = {394}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1999.810781}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 21st Asian Test Symposium TI - Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method SN - 1081-7735 SP EP A1 - Kiyoshi Nikawa, A1 - Shoji Inoue, A1 - Kazuyuki Morimoto, A1 - Shinya Sone, PY - 1999 VL - 0 JA - 2012 IEEE 21st Asian Test Symposium ER - | |||
The IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method was proposed and developed by Nikawa and Tozaki in 1993 and this method has been shown to be applicable for detecting defects and current paths by using test structures and/or artificial failures. Here we present the results of the actual failure analysis from real failures of DRAMs, ASICs, power MOSFETs, and microcomputers, which failed during mass production, development, user tests, and ESD simulation. In the analysis of a microcom-puter, we applied test vectors from an ATE docked to the IR-OBIRCH system, in order to reproduce the failure state dur-ing IR-OBIRCH imaging. The results showed that the IR-OBIRCH is suitable not only for improving reliability but also for increasing yield.
Citation:
Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone, "Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method," ats, pp.394, Eighth Asian Test Symposium (ATS'99), 1999
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