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2012 IEEE 21st Asian Test Symposium (1997)
Akita, JAPAN
Nov. 17, 1997 to Nov. 18, 1997
ISBN: 0-8186-8209-4
TABLE OF CONTENTS
Reviewers (PDF)
pp. xv
Plenary Session: Keynote Address
Session 1A: Test Generation I, Chair: J. Savir, New Jersey Institute of Technology, USA
Irith Pomeranz , University of Iowa
Sudhakar M. Reddy , University of Iowa
pp. 4
Seiji Kajihara , Kyushu Institute of Technology
Tsutomu Sasao , Kyushu Institute of Technology
pp. 10
Tsuyoshi Shinogi , Faculty of Engineering, Mie University
Terumine Hayashi , Faculty of Engineering, Mie University
Kazuo Taki , Faculty of Engineering, Kobe University
pp. 16
Noroyoshi Itazaki , Applied Physics, Osaka Univ.
Yasutaka Idomoto , Applied Physics, Osaka Univ.
Kozo Kinoshita , Applied Physics, Osaka Univ.
pp. 22
Session 1B: Design for Testability I, Chair: S.K. Jhajharia, Singapore Polytechnic, Singapore
S. Chiusano , Politecnico di Torino
F. Corno , Politecnico di Torino
P. Prinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 30
Kwame Osei Boateng , Faculty of Engineering, Ehime University
Hiroshi Takahashi , Faculty of Engineering, Ehime University
Yuzo Takamatsu , Faculty of Engineering, Ehime University
pp. 42
Shiyi Xu , Shanghai University of Science and Technology
Peter Waignjo , Shanghai University of Science and Technology
Percy G. Dias , Fudan University
Bole Shi , Fudan University
pp. 48
Session 2A: Test Generation II, Chair: B. Kaminska, OPMAXX, USA
F. Corno , Politecnico di Torino
P. Prinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
G. Squillero , Politecnico di Torino
pp. 56
Satoshi Ohtake , Nara Institute of Science and Technology
Tomoo Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 62
F. Corno , Politecnico di Torino
P. Prinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 68
Session 2B: Fault Tolerance, Chair: N. Kanekawa, Hitachi, Japan
T. Ito , Dept. of Comput. Sci., Iwate Univ., Morioka, Japan
I. Takanami , Dept. of Comput. Sci., Iwate Univ., Morioka, Japan
pp. 88
M. Tsunoyama , Niigata Inst. of Technol., Japan
M. Uenoyama , Niigata Inst. of Technol., Japan
T. Kabasawa , Niigata Inst. of Technol., Japan
pp. 94
Hendrik Hartje , University of Potsdam
Michael Goessel , University of Potsdam
Egor S. Sogomonyan , Russian Academy of Sciences
pp. 100
Session 3A: Special Session I - Case Studies for DFT Techniques in Japanese Industry, Chair & Coordinator, M. Yoshida, NEC, Japan
Junji Mori , Toshiba Corp.
Ben Mathew , Silicon Graphics Inc.
Dave Burns , Silicon Graphics Inc.
Yeuk-Hai Mok , Silicon Graphics Inc.
pp. 108
K. Hatayama , Hitachi Research Laboratory, Hitachi, Ltd.
M. Ikeda , Hitachi Research Laboratory, Hitachi, Ltd.
M. Takakura , Hitachi Engineering, Co. Ltd.
S. Uchiyama , Hitachi Engineering, Co. Ltd.
Y. Sakamoto , Hitachi Information Technology, Co. Ltd.
pp. 112
T. Yoshida , Corporate Semicond. Dev. Div., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
R. Shimoda , Corporate Semicond. Dev. Div., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
T. Mizokawa , Corporate Semicond. Dev. Div., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
K. Hirayama , Corporate Semicond. Dev. Div., Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
pp. 116
Toshinobu Ono , NEC Corporation, ULSI Systems Development Laboratories
Kazuo Wakui , NEC Corporation, ULSI Systems Development Laboratories
Hitoshi Hikima , NEC Corporation, ULSI Systems Development Laboratories
Yoshiyuki Nakamura , NEC Corporation, ULSI Systems Development Laboratories
Masaaki Yoshida , NEC Corporation, ULSI Systems Development Laboratories
pp. 122
Michiaki Emori , Fujitsu Limited
Junko Kumagai , Fujitsu Limited
Koichi Itaya , Fujitsu Limited
Takashi Aikyo , Fujitsu Limited
Tomoko Anan , Fujitsu Lsi Tecnology Limited
Junichi Niimi , Fujitsu Lsi Tecnology Limited
pp. 126
Session 3B: Test Technologies, Chair: M. Nishihara, IBM Japan
Cheng-Wen Wu , Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 132
Marcel Jacomet , Biel School of Engineering
Roger Waelti , Biel School of Engineering
Lukas Winzenried , Biel School of Engineering
Jaime Perez , Biel School of Engineering
Martin Gysel , Biel School of Engineering
pp. 138
V. Dabholkar , Motorola Inc., Austin, TX, USA
S. Chakravarty , Motorola Inc., Austin, TX, USA
pp. 143
Josep Altet , Universitat Politecnica de Catalunya
Antonio Rubio , Universitat Politecnica de Catalunya
Hideo Tamamoto , Akita University
pp. 149
Z.M. Darus , Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan, Malaysia
I. Ahmed , Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan, Malaysia
L. Ali , Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan, Malaysia
pp. 155
Session 4A: Special Session II - Beam Testing of VLSI Circuits in Japan, Chair: K. Nikawa, NEC, Japan
Katsuyoshi Miura , Faculty of Engineering, Osaka University
Kohei Nakata , Faculty of Engineering, Osaka University
Koji Nakamae , Faculty of Engineering, Osaka University
Hiromu Fujioka , Faculty of Engineering, Osaka University
pp. 162
K. Yamazaki , Dept. of Comput. Sci., Meiji Univ., Kawasaki, Japan
T. Yamada , Dept. of Comput. Sci., Meiji Univ., Kawasaki, Japan
pp. 168
Norio Kuji , NTT System Electronics Laboratories
pp. 174
Session 4B: Mixed-Signal Test, Chair: C.W. Wu, National Tsing Hua University, Taiwan
N. Ben-Hamida , OPMAXX Inc., Beaverton, OR., USA
K. Saab , OPMAXX Inc., Beaverton, OR., USA
D. Marche , OPMAXX Inc., Beaverton, OR., USA
B. Kaminska , OPMAXX Inc., Beaverton, OR., USA
pp. 182
Takahiro Yamaguchi , Advantest Laboratories Ltd.
pp. 188
Chauchin Su , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yi-Ren Cheng , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yue-Tsang Chen , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shing Tenchen , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
pp. 194
Session 5A: Special Session III - Novel Beam Testing Techniques in Japan, Chair: M. Miyoshi, Toshiba, Japan
F. Komatsu , Toshiba Corp.
H. Motoki , Toshiba Corp.
M. Miyoshi , Toshiba Corp.
pp. 202
K. Ozaki , Fujitsu Laboratories Ltd.
H. Sekiguchi , Fujitsu Laboratories Ltd.
S. Wakana , Fujitsu Laboratories Ltd.
Y. Goto , Fujitsu Laboratories Ltd.
Y. Umehara , Advantest Corporation
J. Matsumoto , Advantest Corporation
pp. 208
Session 5B: Decision Diagrams and Logic Optimization; Coordinator: H. Fujioka, Osaka University, Japan
Moon-Bae Song , Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea
Hoon Chang , Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea
pp. 228
Yukihiro Iguchi , Meiji University
Tsutomu Sasao , Kyushu Institute of Technology
Munehiro Matsuura , Kyushu Institute of Technology
pp. 234
Session 6A: FPGA Test, Chair: S. Xu, Shanghai University of Science and Technology, China
H. Michinishi , Dept. of Inf. Technol., Okayama Univ., Japan
T. Yokohira , Dept. of Inf. Technol., Okayama Univ., Japan
T. Okamoto , Dept. of Inf. Technol., Okayama Univ., Japan
T. Inoue , Dept. of Inf. Technol., Okayama Univ., Japan
H. Fujiwara , Dept. of Inf. Technol., Okayama Univ., Japan
pp. 242
W.K. Huang , Fudan University
M.Y. Zhang , Fudan University
F.J. Meyer , Texas A&M University
F. Lombardi , Texas A&M University
pp. 248
M. Renovell , LIRMM-UMII
J.M. Portal , LIRMM-UMII
J. Figueras , Universitat Polytechnica de Catalunya
Y. Zorian , Logic Vision Inc.
pp. 254
Session 6B: Software Test, Chair: T. Yoneda, Tokyo Institute of Technology, Japan
C.-S. D. Yang , University of Delaware
L. L. Pollock , University of Delaware
pp. 263
Osamu Mizuno , Osaka University
Shinji Kusumoto , Osaka University
Tohru Kikuno , Osaka University
Yasunari Takagi , OMRON Corporation, Japan
Keishi Sakamoto , OMRON Corporation, Japan
pp. 269
Session 7A: Diagnosis, Chair: Y. Min, Chinese Academy of Sciences, China
Tomoo Inoue , Nara Institute of Science and Technology
Satoshi Miyazaki , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 276
Wen Xiaoqing , Dept. of Information Engineering, Akita 010, Japan
pp. 282
Chih Wei Hu , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Chung Len Lee , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Wen Ching Wu , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
J.E. Chen , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 288
Session 7B: Design for Testability II, Chair: A. Ivanov, University of British Columbia, Canada
Sandeep Bhatia , Duet Technologies Inc.
Prab Varma , Duet Technologies Inc.
pp. 300
Session 8A: Delay Test, Chair: C. Landrault, LIRMM, France
S. Chakravarty , Intel Corp., Santa Clara, CA, USA
pp. 314
Wangning Long , Tsinghua University
Shiyuan Yang , Tsinghua University
Zhongcheng Li , Chinese Academy of Science
Yinghua Min , Chinese Academy of Science
pp. 326
Xiaoming Yu , Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Yinghua Min , Inst. of Comput. Technol., Acad. Sinica, Beijing, China
pp. 332
Session 8B: Built-in Self-Test I, Chair: K. Iwasaki, Tokyo Metropolitan University, Japan
Kowen Lai , Rockwell Semicond. Syst., Newport Beach, CA, USA
C.A. Papachristou , Rockwell Semicond. Syst., Newport Beach, CA, USA
M. Baklashov , Rockwell Semicond. Syst., Newport Beach, CA, USA
pp. 338
Jacob Savir , New Jersey Institute of Technology
pp. 343
Hiroshi Yokoyama , Mining College, Akita University
Xiaoqing Wen , Mining College, Akita University
Hideo Tamamoto , Mining College, Akita University
pp. 353
Michinobu Nakao , Hitachi Research Laboratory, Hitachi, Ltd.
Kazumi Hatayama , Hitachi Research Laboratory, Hitachi, Ltd.
Isao Higashi , General Purpose Computer Division, Hitachi, Ltd.,
pp. 359
Session 9A: Current Testing, Chair: J.E. Chen, Chung-Hua Polytechnic Institute, Taiwan
M. Dalmia , Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
A. Ivanov , Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
S. Tabatabaei , Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
pp. 366
Masaki Hashizume , The Univ. of Tokushima
Toshimasa Kuchii , The Univ. of Tokushima
Takeomi Tamesada , The Univ. of Tokushima
pp. 372
IDDT Testing (Abstract)
Yinghua Min , Institute of Computing Technology, Chinese Academy of Sciences
Zhuxing Zhao , Institute of Computing Technology, Chinese Academy of Sciences
Zhongcheng Li , Institute of Computing Technology, Chinese Academy of Sciences
pp. 378
Tsung-Chu Huang , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Min-Cheng Huang , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Kuen-Jong Lee , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
pp. 384
Session 9B: Built-in Self-Test II, Chair: T. Tada, Mitsubishi, Japan
Yuejian Wu , Northern Telecom., Ltd.
Sanjay Gupta , Northern Telecom., Ltd.
pp. 398
Gang-Min Park , Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea
Hoon Chang , Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea
pp. 404
Dariusz Badura , Silesian University of Katowice
Andrzej Hlawiczka , Silesian Technical University of Gliwice
pp. 410
Author Index (PDF)
pp. 416
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