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Sixth Asian Test Symposium (ATS'97)
Akita, JAPAN
November 17-November 18
ISBN: 0-8186-8209-4
| ASCII Text | x | ||
| "Embedded Test and Measurement Critical for Deep Submicron Technology," 2012 IEEE 21st Asian Test Symposium, pp. 2, Sixth Asian Test Symposium (ATS'97), 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/ATS.1997.10004, author = {}, title = {Embedded Test and Measurement Critical for Deep Submicron Technology}, journal ={2012 IEEE 21st Asian Test Symposium}, volume = {0}, year = {1997}, issn = {1081-7735}, pages = {2}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.10004}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 21st Asian Test Symposium TI - Embedded Test and Measurement Critical for Deep Submicron Technology SN - 1081-7735 SP EP PY - 1997 VL - 0 JA - 2012 IEEE 21st Asian Test Symposium ER - | |||
Citation:
"Embedded Test and Measurement Critical for Deep Submicron Technology," ats, pp.2, Sixth Asian Test Symposium (ATS'97), 1997
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