• A
  • ATS
  • 1996
  • Fifth Asian Test Symposium (ATS'96)
Advanced Search 
Fifth Asian Test Symposium (ATS'96)
Hsinchu, TAIWAN
November 20-November 22
ISBN: 0-8186-7478-4
Table of Contents
Reviewers (PDF)
pp. xviii
Plenary Session: Keynote Speech
Session 1A: Test Pattern Generation
Hsing-Chung Liang, National Chiao Tung University
Chung Len Lee, National Chiao Tung University
Jwu E Chen, National Chiao Tung University
pp. 10
Session 1B: Board and System-Level Test
Po-Ching Hsu, Holtek Microelectron. Inc., Hsinchu, Taiwan
Sying-Jyan Wang, Holtek Microelectron. Inc., Hsinchu, Taiwan
pp. 56
Chauchin Su, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shyh-Shen Hwang, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shyh-Jye Jou, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yuan-Tzu Ting, Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
pp. 62
Hiroyuki Michinishi, Okayama University
Tokumi Yokohira, Okayama University
Takuji Okamoto, Okayama University
Tomoo Inoue, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
pp. 68
Session 2A: Design for Testability
Toshinori Hosokawa, Matsushita Electric Industrial Co., Ltd.
Kenichi Kawaguchi, Matsushita Electric Industrial Co., Ltd.
Mitsuyasu Ohta, Matsushita Electric Industrial Co., Ltd.
Michiaki Muraoka, Matsushita Electric Industrial Co., Ltd.
pp. 88
Kuen-Jong Lee, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Jing-Jou Tang, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Tsung-Chu Huang, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Cheng-Liang Tsai, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
pp. 100
Session 2B: Concurrent Error Detection and Fault Tolerance
Naotake Kamiura, Himeji Institute of Technology
Yutaka Hata, Himeji Institute of Technology
Kazuharu Yamato, Himeji Institute of Technology
pp. 107
K. Kawakubo, Fac. of Eng., Fukuyama Univ., Japan
K. Tanaka, Fac. of Eng., Fukuyama Univ., Japan
H. Hiraishi, Fac. of Eng., Fukuyama Univ., Japan
pp. 119
Session 3A: Synthesis for Testability
T. Inoue, Nara Inst. of Sci. & Technol., Japan
T. Masuzawa, Nara Inst. of Sci. & Technol., Japan
H. Youra, Nara Inst. of Sci. & Technol., Japan
H. Fujiwara, Nara Inst. of Sci. & Technol., Japan
pp. 130
Zhuxing Zhao, Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Zhongcheng Li, Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Yinghua Min, Inst. of Comput. Technol., Acad. Sinica, Beijing, China
pp. 136
Li-Ren Huang, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Jing-Yang Jou, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Sy-Yen Kuo, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Wen-Bin Liao, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 142
Harry Hengster, Albert-Ludwigs-University
Rolf Drechsler, Albert-Ludwigs-University
Bernd Becker, Albert-Ludwigs-University
Stefan Eckrich, Johann Wolfgang Goethe-University
Tonja Pfeiffer, Johann Wolfgang Goethe-University
pp. 148
U. Sparmann, University of Saarland
H. Mueller, University of Saarland
S.M. Reddy, University of Iowa
pp. 155
Session 3B: IDDQ and Fault Modeling
Kuen-Jong Lee, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Jing-Jou Tang, Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
pp. 165
A.J. van de Goor, Delft University of Technology
G.N. Gaydadjiev, Delft University of Technology
pp. 183
Session 4A: Built-In Self-Test
Li-Ren Huang, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Jing-Yang Jou, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Sy-Yen Kuo, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 199
Bin-Hong Lin, National Tsing Hua University
Shao-Hui Shieh, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
pp. 213
Session 4B: Circuit and System-Level Diagnostics
Yuan Tzu Ting, Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
Li Wei Chao, Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
Wei Chung Chao, Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
pp. 238
Christopher P. Fuhrman, Swiss Federal Institute of Technology
Henri J. Nussbaumer, Swiss Federal Institute of Technology
pp. 244
Session 5A: Industrial Applications
Najmi Jarwala, Lucent Technologies Bell Labs Innovations
Paul W. Rutkowski, Lucent Technologies Bell Labs Innovations
Shianling Wu, Lucent Technologies Bell Labs Innovations
Chi Yau, Lucent Technologies Bell Labs Innovations
pp. 251
V.C. Alves, COPPE, Univ. Fed. do Rio de Janeiro, Brazil
A.R. Antunes, COPPE, Univ. Fed. do Rio de Janeiro, Brazil
M. Marzouki, COPPE, Univ. Fed. do Rio de Janeiro, Brazil
pp. 263
Session 5B: Practical Issues
Cheng-Ping Wang, Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Chin-Long Wey, Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
pp. 276
V. Székely, Technical University of Budapest
M. Rencz, Technical University of Budapest
J.M Karam, TIMA
pp. 282
Xiaofan Yang, Comput. Inst., Chongqing Univ., China
Tinghuai Chen, Comput. Inst., Chongqing Univ., China
Zehan Cao, Comput. Inst., Chongqing Univ., China
Zhongshi He, Comput. Inst., Chongqing Univ., China
Hongqing Cao, Comput. Inst., Chongqing Univ., China
pp. 289
S. Demidenko, Singapore Polytech., Singapore
V. Piuri, Singapore Polytech., Singapore
pp. 295
Usage of this product signifies your acceptance of the Terms of Use.