The Community for Technology Leaders
RSS Icon
Subscribe
2012 IEEE 21st Asian Test Symposium (1996)
Hsinchu, TAIWAN
Nov. 20, 1996 to Nov. 22, 1996
ISBN: 0-8186-7478-4
TABLE OF CONTENTS
pp. xvi
Reviewers (PDF)
pp. xviii
Plenary Session: Keynote Speech
Session 1A: Test Pattern Generation
Vishwani D. Agrawal , Bell Labs Lucent Technologies
Michael L. Bushnell , Rutgers University
Qing Lin , Sun Microsystems
pp. 4
Hsing-Chung Liang , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
Jwu E Chen , National Chiao Tung University
pp. 10
Dirk Stroobandt , University of Ghent
Jan Van Campenhout , University of Ghent
pp. 22
J.T. van der Linden , Delft University of Technology
M.H. Konijnenburg , Delft University of Technology
A.J. van de Goor , Delft University of Technology
pp. 29
Session 1B: Board and System-Level Test
Wuudiann Ke , Lucent Technologies Bell Labs.
pp. 44
Jin-Hua Hong , National Tsing Hua University
Chung-Hung Tsai , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 50
Po-Ching Hsu , Holtek Microelectron. Inc., Hsinchu, Taiwan
Sying-Jyan Wang , Holtek Microelectron. Inc., Hsinchu, Taiwan
pp. 56
Chauchin Su , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shyh-Shen Hwang , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Shyh-Jye Jou , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Yuan-Tzu Ting , Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
pp. 62
Hiroyuki Michinishi , Okayama University
Tokumi Yokohira , Okayama University
Takuji Okamoto , Okayama University
Tomoo Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 68
Wang-Dauh Tseng , National Chiao Tung University
Kuochen Wang , National Chiao Tung University
pp. 75
Session 2A: Design for Testability
Yoshihiro Konno , NEC Corporation
Kazushi Nakamura , NEC Corporation
Tatsushige Bitoh , NEC Corporation
Koji Saga , NEC Corporation
Seiken Yano , NEC Corporation
pp. 82
Toshinori Hosokawa , Matsushita Electric Industrial Co., Ltd.
Kenichi Kawaguchi , Matsushita Electric Industrial Co., Ltd.
Mitsuyasu Ohta , Matsushita Electric Industrial Co., Ltd.
Michiaki Muraoka , Matsushita Electric Industrial Co., Ltd.
pp. 88
Kuen-Jong Lee , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Jing-Jou Tang , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Tsung-Chu Huang , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Cheng-Liang Tsai , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
pp. 100
Session 2B: Concurrent Error Detection and Fault Tolerance
Naotake Kamiura , Himeji Institute of Technology
Yutaka Hata , Himeji Institute of Technology
Kazuharu Yamato , Himeji Institute of Technology
pp. 107
Yoon-Hwa Choi , Hongik University, Seoul, Korea
Pong-Gyou Lee , Hongik University, Seoul, Korea
pp. 113
K. Kawakubo , Fac. of Eng., Fukuyama Univ., Japan
K. Tanaka , Fac. of Eng., Fukuyama Univ., Japan
H. Hiraishi , Fac. of Eng., Fukuyama Univ., Japan
pp. 119
Yupin Luo , Tsinghua University
Shiyuan Yang , Tsinghua University
Dongcheng Hu , Tsinghua University
pp. 123
Session 3A: Synthesis for Testability
T. Inoue , Nara Inst. of Sci. & Technol., Japan
T. Masuzawa , Nara Inst. of Sci. & Technol., Japan
H. Youra , Nara Inst. of Sci. & Technol., Japan
H. Fujiwara , Nara Inst. of Sci. & Technol., Japan
pp. 130
Zhuxing Zhao , Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Zhongcheng Li , Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Yinghua Min , Inst. of Comput. Technol., Acad. Sinica, Beijing, China
pp. 136
Li-Ren Huang , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Jing-Yang Jou , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Sy-Yen Kuo , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Wen-Bin Liao , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 142
Harry Hengster , Albert-Ludwigs-University
Rolf Drechsler , Albert-Ludwigs-University
Bernd Becker , Albert-Ludwigs-University
Stefan Eckrich , Johann Wolfgang Goethe-University
Tonja Pfeiffer , Johann Wolfgang Goethe-University
pp. 148
U. Sparmann , University of Saarland
H. Mueller , University of Saarland
S.M. Reddy , University of Iowa
pp. 155
Session 3B: IDDQ and Fault Modeling
Kuen-Jong Lee , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Jing-Jou Tang , Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
pp. 165
Toshimasa Kuchii , The University of Tokushima
Masaki Hashizume , The University of Tokushima
Takeomi Tamesada , The University of Tokushima
pp. 171
Hisashi Kondo , Kawasaki Steel Corp.
Kwang-Ting Cheng , University of California, Santa Barbara
pp. 177
A.J. van de Goor , Delft University of Technology
G.N. Gaydadjiev , Delft University of Technology
pp. 183
Plenary Session: Keynote Speech
Session 4A: Built-In Self-Test
Li-Ren Huang , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Jing-Yang Jou , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Sy-Yen Kuo , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 199
Bin-Hong Lin , National Tsing Hua University
Shao-Hui Shieh , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 213
Session 4B: Circuit and System-Level Diagnostics
Tao Wei , Hong Kong Polytechnic University
Mike W.T. Wong , Hong Kong Polytechnic University
Y.S. Lee , Hong Kong Polytechnic University
pp. 232
Yuan Tzu Ting , Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
Li Wei Chao , Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
Wei Chung Chao , Chung Sun Inst. of Sci. & Technol., Lung-Tan, Taiwan
pp. 238
Christopher P. Fuhrman , Swiss Federal Institute of Technology
Henri J. Nussbaumer , Swiss Federal Institute of Technology
pp. 244
Session 5A: Industrial Applications
Najmi Jarwala , Lucent Technologies Bell Labs Innovations
Paul W. Rutkowski , Lucent Technologies Bell Labs Innovations
Shianling Wu , Lucent Technologies Bell Labs Innovations
Chi Yau , Lucent Technologies Bell Labs Innovations
pp. 251
V.C. Alves , COPPE, Univ. Fed. do Rio de Janeiro, Brazil
A.R. Antunes , COPPE, Univ. Fed. do Rio de Janeiro, Brazil
M. Marzouki , COPPE, Univ. Fed. do Rio de Janeiro, Brazil
pp. 263
Session 5B: Practical Issues
Cheng-Ping Wang , Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Chin-Long Wey , Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
pp. 276
V. Székely , Technical University of Budapest
M. Rencz , Technical University of Budapest
J.M Karam , TIMA
pp. 282
Xiaofan Yang , Comput. Inst., Chongqing Univ., China
Tinghuai Chen , Comput. Inst., Chongqing Univ., China
Zehan Cao , Comput. Inst., Chongqing Univ., China
Zhongshi He , Comput. Inst., Chongqing Univ., China
Hongqing Cao , Comput. Inst., Chongqing Univ., China
pp. 289
S. Demidenko , Singapore Polytech., Singapore
V. Piuri , Singapore Polytech., Singapore
pp. 295
Author Index (PDF)
pp. 301
5 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool