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Second Working Conference on Asynchronous Design Methodologies
Testing C-elements is not elementary
London, England
May 30-May 31
ISBN: 0-8186-7098-3
ASCII Text
x 
 
J.A. Brzozowski, K. Raahemifar, "Testing C-elements is not elementary," 2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems, pp. 150, Second Working Conference on Asynchronous Design Methodologies, 1995.
 
 
BibTex
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@article{ 10.1109/WCADM.1995.514652,
author = {J.A. Brzozowski and K. Raahemifar},
title = {Testing C-elements is not elementary},
journal ={2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems},
volume = {0},
year = {1995},
isbn = {0-8186-7098-3},
pages = {150},
doi = {http://doi.ieeecomputersociety.org/10.1109/WCADM.1995.514652},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems
TI - Testing C-elements is not elementary
SN - 0-8186-7098-3
SP
EP
A1 - J.A. Brzozowski,
A1 - K. Raahemifar,
PY - 1995
KW - asynchronous circuits; logic testing; fault location; C-elements testing; stuck-at faults; gate circuits; C-element; logic tests; speed-independence; CMOS implementations
VL - 0
JA - 2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems
ER -
 
J.A. Brzozowski, Dept. of Comput. Sci., Waterloo Univ., Ont., Canada
K. Raahemifar, Dept. of Comput. Sci., Waterloo Univ., Ont., Canada
We examine stuck-at faults in several gate circuits realizing the C-element. We exhibit circuits with the following phenomena: (a) 50% of single faults do not cause the circuit to halt. (b) Some faults are not detectable by logic tests. (c) A test of length seven is required to detect all detectable single faults. (d) A fault may result in an oscillation. (e) A fault may destroy the speed-independence of a circuit. We also analyze static and dynamic CMOS implementations of the C-element.
Index Terms:
asynchronous circuits; logic testing; fault location; C-elements testing; stuck-at faults; gate circuits; C-element; logic tests; speed-independence; CMOS implementations
Citation:
J.A. Brzozowski, K. Raahemifar, "Testing C-elements is not elementary," async, pp.150, Second Working Conference on Asynchronous Design Methodologies, 1995
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