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21st IEEE International Conference on Automated Software Engineering (ASE'06)
A methodology for automated test generation guided by functional coverage constraints at specification level
Tokyo, Japan
September 18-September 22
ISBN: 0-7695-2579-2
| ASCII Text | x | ||
| Odile Laurent, Christel Seguin, Virginie Wiels, "A methodology for automated test generation guided by functional coverage constraints at specification level," 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011), pp. 285-288, 21st IEEE International Conference on Automated Software Engineering (ASE'06), 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/ASE.2006.6, author = {Odile Laurent and Christel Seguin and Virginie Wiels}, title = {A methodology for automated test generation guided by functional coverage constraints at specification level}, journal ={2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011)}, volume = {0}, year = {2006}, issn = {1527-1366}, pages = {285-288}, doi = {http://doi.ieeecomputersociety.org/10.1109/ASE.2006.6}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011) TI - A methodology for automated test generation guided by functional coverage constraints at specification level SN - 1527-1366 SP285 EP288 A1 - Odile Laurent, A1 - Christel Seguin, A1 - Virginie Wiels, PY - 2006 KW - null VL - 0 JA - 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011) ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ASE.2006.6
This paper presents an approach to automate test generation from a formal specification and a set of functional test objectives while taking into account coverage constraints at the specification level. We use existing test generation techniques and tools, our contribution is on the methodological side. We define an innovative approach adapted to the industrial domain and its constraints.
Citation:
Odile Laurent, Christel Seguin, Virginie Wiels, "A methodology for automated test generation guided by functional coverage constraints at specification level," ase, pp.285-288, 21st IEEE International Conference on Automated Software Engineering (ASE'06), 2006
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