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- AIPR
- 2006
- 35th Applied Imagery and Pattern Recognition Workshop (AIPR'06)
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35th Applied Imagery and Pattern Recognition Workshop (AIPR'06) Washington, DC, USA October 11-October 13 ISBN: 0-7695-2739-6 Table of Contents
 | Introduction |
 | Session 1: 3D Imaging with Active Systems |
John Dammann, Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783
Brian Redman, Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783
William Ruff, Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 pp. 4
James S. Albus, Intelligent Systems Division National Institute of Standards and Technology
Tsai Hong, Intelligent Systems Division National Institute of Standards and Technology
Tommy Chang, Intelligent Systems Division National Institute of Standards and Technology pp. 7
 | Session 2: Model Based Image Analysis |
Manasi Datar, Imaging Technologies, GE Global Research, Bangalore, India
Sohan Ranjan, Imaging Technologies, GE Global Research, Bangalore, India
Rakesh Mullick, Imaging Technologies, GE Global Research, Bangalore, India pp. 10
Hiroshi Oka, Keio University Faculty of Science and Technology.
Masaru Tanaka, Tokyo Women's Medical University Medical Center East pp. 11
M. Foedisch, National Institute of Standards and Technology (NIST)
R. Madhavan, National Institute of Standards and Technology (NIST)
C. Schlenoff, National Institute of Standards and Technology (NIST) pp. 12
 | Invited Presentation |
 | Session 3: Data Integration and Decision Support |
 | Session 4: Model Based Video Enhancement |
 | Reception and Poster Session |
 | Session 5: Image Classification Tools and Algorithms |
Teddy Ko, Raytheon Information Solutions pp. 26
Rong Duan, Stevens Institute of Technology Castle Point on Hudson, Hoboken, NJ, USA
Wei Jiang, Stevens Institute of Technology Castle Point on Hudson, Hoboken, NJ, USA
Hong Man, Stevens Institute of Technology Castle Point on Hudson, Hoboken, NJ, USA pp. 29
 | Session 6: Technology Readiness of High-Performance Algorithms |
R. Madhavan, National Institute of Standards and Technology
E. Messina, National Institute of Standards and Technology pp. 31
Scott Spetka, SUNY Institute of Technology And ITT Corporation pp. 32
Tom Heinze, National Geospatial-Intelligence Agency pp. 34
Wensheng Hu, General Electric Global Research, Niskayuna, NY pp. 35 Usage of this product signifies your acceptance of the Terms of Use.
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