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  • 34th Applied Imagery and Pattern Recognition Workshop (AIPR'05)
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34th Applied Imagery and Pattern Recognition Workshop (AIPR'05)
Washington, DC
October 19-October 21
ISBN: 0-7695-2479-6
Table of Contents
Cover
Introduction
Session 1: Concealed Weapon Detection for Homeland Security and Defense
Kurt J. Linden, Spire Corporation
William R. Neal, Spire Corporation
Jerry Waldman, University of Massachusetts Lowell
Andrew J. Gatesman, University of Massachusetts Lowell
Andriy Danylov, University of Massachusetts Lowell
pp. 7-14
Anjani Achanta, Luna Innovations Inc.,
Mark McKenna, Luna Innovations Inc.,
Joseph Heyman, Luna Innovations Inc.
Kevin Rudd, College of William and Mary
Mark Hinders, College of William and Mary
Peter Costianes, Air Force Research Lab
pp. 21-27
Section 2: Remote Imaging for Homeland Security and Defense
Mohamed Mahfouz, University of Tennessee
Aly Fathy, University of Tennessee
Yunqiang Yang, University of Tennessee
Emam ElHak Ali, University of Tennessee
Ahmed Badawi, University of Tennessee
pp. 48-53
Aya Sayedelahl, Howard University
R. Phillip Bording, Memorial University of Newfoundland, Canada
Mohamed Chouikha, Howard University
Jianchao Zeng, Howard University
pp. 58-62
Rick Kendrick, Lockheed Martin Space Systems Company
Jason Mudge, Lockheed Martin Space Systems Company
David N. Christie, Lockheed Martin Space Systems Company
Eamon Barrett, Lockheed Martin Space Systems Company
pp. 70-73
Xiaofeng Fan, Rocherster Institute of Technology
Harvey Rho, Rocherster Institute of Technology
Eli Saber, Rocherster Institute of Technology
pp. 81-86
Poster Session
Li Tao, Old Dominion University
Hau Ngo, Old Dominion University
Ming Zhang, Old Dominion University
Adam Livingston, Old Dominion University
Vijayan Asari, Old Dominion Univesity
pp. 106-113
Session 3: Biomedical Imaging
Girish Gopalakrishnan, GE Global Research Center, India
S V Bharath Kumar, GE Global Research Center, India
Ajay Narayanan, GE Global Research Center, India
Rakesh Mullick, GE Global Research Center, India
pp. 114-119
Vishal Saxena, University of Southern California
Jon F. Nielsen, University of Southern California
Ignacio Gonzalez-Gomez, Univesity of Southern California
Gevorg Karapetyan, University of Southern California
Vazgen Khankaldyyan, University of Southern California
Marvin D. Nelson, University of Southern California
Walter E. Laug, University of Southern Califonria
pp. 126-132
Egidijus E. Uzgiris, General Electric Global Research
Deborah Lee, General Electric Global Research
Anup Sood, General Electric Global Research
Kathleen Bove, General Electric Global Research
Steve Lomnes, General Electric Global Research
pp. 133-139
Murat Guven, Rensselaer Polytechnic Institute
Birsen Yazici, Rensselaer Polytechnic Institute
Xavier Intes, University of Pennsylvania
Britton Chance, University of Pennsylvania
pp. 140-145
Murat Guven, Rensselaer Polytechnic Institute
Birsen Yazici, Rensselaer Polytechnic Institute
Kiwoon Kwon, Rensselaer Polytechnic Institute
Eldar Giladi, Rensselaer Polytechnic Institute
pp. 146-151
Session 4: Multimodal Pattern Recognition and ATR
R. Madhavan, National Institute of Standards and Technology
M. Foedisch, National Institute of Standards and Technology
T. Chang, National Institute of Standards and Technology
T. Hong, National Institute of Standards and Technology
pp. 166-172
Balasubramanian Lakshminarayanan, The University of Tennessee Knoxville
Hairong Qi, The University of Tennessee Knoxville
pp. 173-178
Scott K. Ralph, Charles River Analytics
Magn? Snorrason, Charles River Analytics
Mark R. Stevens, Charles River Analytics
pp. 192-197
Zhigang Zhu, The City College of New York
Hao Tang, The City College of New York
George Wolberg, The City College of New York
Jeffery R. Layne, Air Force Research Laboratory
pp. 198-203
Umar Shahbaz Khan, National University of Science and Technology, Pakistan
Javaid Iqbal, National University of Science and Technology, Pakistan
Mahmood A. Khan, National University of Science and Technology, Pakistan
pp. 210-217
Session 5: Fusion Multimodal and Modeling
Yunqian Ma, Honeywell Labs
Zheng Wang, Honeywell Technology Solution Lab, China
Mike Bazakos, Honeywell Labs
Wing Au, Honeywell Labs
pp. 224-229
Author Index
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