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33rd Applied Imagery Pattern Recognition Workshop (AIPR'04)
Cosmos Club, Washington, DC
October 13-October 15
ISBN: 0-7695-2250-5
Table of Contents
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Physically Motivated Algorithms
Rick Kendrick, Lockheed Martin Space Systems Company, Sunnyvale, California
Eric H. Smith, Lockheed Martin Space Systems Company, Sunnyvale, California
David N. Christie, Lockheed Martin Space Systems Company, Sunnyvale, California
David A. Bennett, Lockheed Martin Space Systems Company, Sunnyvale, California
David Theil, Lockheed Martin Space Systems Company, Sunnyvale, California
Eamon Barrett, Lockheed Martin Space Systems Company, Sunnyvale, California
pp. 3-9
Joseph L. Mundy, Brown University
Chung-Fu Chang, Lockheed Martin Integrated Systems and Solutions, Goodyear, Arizona
pp. 10-15
Mike Foedisch, National Institute of Standards and Technology, Gaithersburg, MD
Aya Takeuchi, Advanced Technology and Research, Corp., Burtonsville, MD
pp. 16-21
R. Madhavan, National Institute of Standards and Technology, Gaithersburg, MD
T. Hong, National Institute of Standards and Technology, Gaithersburg, MD
pp. 39-44
Biologically Inspired Algorithms
Gail A. Carpenter, Boston University, MA
Siegfried Martens, Boston University, MA
Ennio Mingolla, Boston University, MA
Ogi J. Ogas, Boston University, MA
Chaitanya Sai, Boston University, MA
pp. 61-66
Mark Flynn, Los Alamos National Laboratory
Henry Abarbanel, University of California, San Diego
Garrett Kenyon, Los Alamos National Laboratory
pp. 79-85
Kernel-Based Methods and Combinations of Classifiers
John T. Rickard, Lockheed Martin Orincon, Larkspur, CO
Ronald R. Yager, Machine Intelligence Institute, Iona College, New Rochelle, NY
Wendy Miller, Lockheed Martin Orincon, San Diego, CA
pp. 106-111
Hiram A. Firpi, Department of Electrical and Computer Engineering Michigan State University
Erik Goodman, Department of Electrical and Computer Engineering Michigan State University
pp. 112-118
Hau T. Ngo, Old Dominion University, Norfolk, VA
Li Tao, Old Dominion University, Norfolk, VA
Vijayan K. Asari, Old Dominion University, Norfolk, VA
pp. 124-129
Geoffrey Wall, Florida State University, Tallahassee, FL; FAMU FSU College of Engineering, Tallahassee, FL
Faizal Iqbal, FAMU FSU College of Engineering, Tallahassee, FL
Jason Isaacs, FAMU FSU College of Engineering, Tallahassee, FL
Xiuwen Liu, Florida State University, Tallahassee, FL
Simon Foo, FAMU FSU College of Engineering, Tallahassee, FL
pp. 130-135
Medical and Biometrics
Shani Ross, Howard University, Washington DC
O'tega Ejofodomi, Howard University, Washington DC
Ahmed Jendoubi, Howard University, Washington DC
Mohamed Chouikha, Howard University, Washington DC
Ben Lo, Georgetown University, Washington DC
Paul Wang, Howard University, Washington DC
Jianchao Zeng, Howard University, Washington DC
pp. 139-144
Ahmed Jendoubi, Howard University, Washington DC
Jianchao Zeng, Howard University, Washington DC
Mohamed F. Chouikha, Howard University, Washington DC
pp. 145-149
Rajkiran Gottumukkal, Old Dominion University, Norfolk, VA
Vijayan K. Asari, Old Dominion University, Norfolk, VA
pp. 150-152
Navchetan Singh, Baba Banda Singh Bahadur Engineering College, Punjab, India
pp. 153-158
Li Hua-ming, Northwest University, Xi'an , P.R. China
Zhou Ming-quan, Northwest University, Xi'an , P.R. China
Geng Guo-hua, Northwest University, Xi'an , P.R. China
pp. 171-176
Validation Methods
Charles Fenimore, National Institute of Standards and Technology
John Roberts, National Institute of Standards and Technology
Charles Watts, Moriarty and Associates
Michelle Brennan, Moriarty and Associates
Ana Ivelisse Avil?, National Institute of Standards and Technology
Paul F. Tighe, Booz, Allen, and Hamilton
Richard J. Behrens, Mitre Corporation
pp. 179-183
James Theiler, Los Alamos National Laboratory
Neal Harvey, Los Alamos National Laboratory
Nancy A. David, Los Alamos National Laboratory
John M. Irvine, Science Applications International Corporation
pp. 184-189
Waleed A. Yousef, George Washington University
Robert F. Wagner, Center for Devices & Radiological Health, FDA
Murray H. Loew, George Washington University
pp. 190-195
S. Alirezaee, AmirKabir Univ. of Tech., Tehran, Iran; University of Windsor, Canada
H. Aghaeinia, AmirKabir Univ. of Tech., Tehran, Iran
M. Ahmadi, University of Windsor, Canada
K. Faez, AmirKabir Univ. of Tech., Tehran, Iran
pp. 196-201
Scott K. Ralph, Charles River Analytics, Cambridge, MA
John Irvine, SAIC, Burlington, MA
Mark R. Stevens, Charles River Analytics, Cambridge, MA
Magn? Snorrason, Charles River Analytics, Cambridge, MA
David Gwilt, AFRL/SNAA Wright Patterson, AFB, Dayton, OH
pp. 202-207
Novel Applications
Ryan O'Grady, Cybernet Systems Corporation, Ann Arbor, MI
Charles J. Cohen, Cybernet Systems Corporation, Ann Arbor, MI
Glenn Beach, Cybernet Systems Corporation, Ann Arbor, MI
Gary Moody, Cybernet Systems Corporation, Ann Arbor, MI
pp. 211-216
Jean-Pierre Peters, University of Namur, Belgium
C?line Thillou, Facult? Polytechnique de Mons, Belgium
Silvio Ferreira, Facult? Polytechnique de Mons, Belgium
pp. 217-222
Mi-Ae Ko, Kyungpook National University, Korea
Young-Mo Kim, Kyungpook National University, Korea
pp. 235-240
O'tega Ejofodomi, Howard University, Washington DC
Shani Ross, Howard University, Washington DC
Ahmed Jendoubi, Howard University, Washington DC
Mohamed Chouikha, Howard University, Washington DC
Jianchao Zeng, Howard University, Washington DC
pp. 241-245
S. Alirezaee, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran; University of Windsor, Canada
H. Aghaeinia, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran
M. Ahmadi, University of Windsor, Canada
K. Faez, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran
pp. 246-250
Jamie Price, Naval Research Laboratory, Washington DC
Carlos Maraviglia, Naval Research Laboratory, Washington DC
William Seisler, Naval Research Laboratory, Washington DC
Elmer Williams, Naval Research Laboratory, Washington DC
Myron Pauli, Naval Research Laboratory, Washington DC
pp. 257-262
Author Index (PDF)
pp. 263-264
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