ISBN: 0-7695-2250-5

Rick Kendrick, Lockheed Martin Space Systems Company, Sunnyvale, California

Eric H. Smith, Lockheed Martin Space Systems Company, Sunnyvale, California

David N. Christie, Lockheed Martin Space Systems Company, Sunnyvale, California

David A. Bennett, Lockheed Martin Space Systems Company, Sunnyvale, California

David Theil, Lockheed Martin Space Systems Company, Sunnyvale, California

Eamon Barrett, Lockheed Martin Space Systems Company, Sunnyvale, California

Joseph L. Mundy, Brown University

Chung-Fu Chang, Lockheed Martin Integrated Systems and Solutions, Goodyear, Arizona

Mike Foedisch, National Institute of Standards and Technology, Gaithersburg, MD

Aya Takeuchi, Advanced Technology and Research, Corp., Burtonsville, MD

Lewis Reynolds, Data Fusion Corporation

Woody Kober, Data Fusion Corporation

Michael H. Brill, Datacolor, Lawrenceville, NJ

A. Schaum, IEEE

Alan Stocker, IEEE

R. Madhavan, National Institute of Standards and Technology, Gaithersburg, MD

T. Hong, National Institute of Standards and Technology, Gaithersburg, MD

Robert J. Bonneau, AFRL/SNRT, USA

Jason M. Kinser, George Mason University

Guisong Wang, George Mason University

Jason Kinser, George Mason University

Gail A. Carpenter, Boston University, MA

Siegfried Martens, Boston University, MA

Ennio Mingolla, Boston University, MA

Ogi J. Ogas, Boston University, MA

Chaitanya Sai, Boston University, MA

Olaf Sporns, Indiana University, Bloomington, IN

David Arathorn, Montana State University, Bozeman, MT

Mark Flynn, Los Alamos National Laboratory

Henry Abarbanel, University of California, San Diego

Garrett Kenyon, Los Alamos National Laboratory

Jeffrey B. Colombe, The MITRE Corporation, McLean VA

David Portnoy, The George Washington University

Peter Bock, The George Washington University

Simon Berkovich, George Washington University

Mohammad Inayatullah, George Washington University

John T. Rickard, Lockheed Martin Orincon, Larkspur, CO

Ronald R. Yager, Machine Intelligence Institute, Iona College, New Rochelle, NY

Wendy Miller, Lockheed Martin Orincon, San Diego, CA

Hiram A. Firpi, Department of Electrical and Computer Engineering Michigan State University

Erik Goodman, Department of Electrical and Computer Engineering Michigan State University

Hiram A. Firpi, Michigan State University

Erik D. Goodman, Michigan State University

Hau T. Ngo, Old Dominion University, Norfolk, VA

Li Tao, Old Dominion University, Norfolk, VA

Vijayan K. Asari, Old Dominion University, Norfolk, VA

Geoffrey Wall, Florida State University, Tallahassee, FL; FAMU FSU College of Engineering, Tallahassee, FL

Faizal Iqbal, FAMU FSU College of Engineering, Tallahassee, FL

Jason Isaacs, FAMU FSU College of Engineering, Tallahassee, FL

Xiuwen Liu, Florida State University, Tallahassee, FL

Simon Foo, FAMU FSU College of Engineering, Tallahassee, FL

Shani Ross, Howard University, Washington DC

O'tega Ejofodomi, Howard University, Washington DC

Ahmed Jendoubi, Howard University, Washington DC

Mohamed Chouikha, Howard University, Washington DC

Ben Lo, Georgetown University, Washington DC

Paul Wang, Howard University, Washington DC

Jianchao Zeng, Howard University, Washington DC

Ahmed Jendoubi, Howard University, Washington DC

Jianchao Zeng, Howard University, Washington DC

Mohamed F. Chouikha, Howard University, Washington DC

Rajkiran Gottumukkal, Old Dominion University, Norfolk, VA

Vijayan K. Asari, Old Dominion University, Norfolk, VA

Navchetan Singh, Baba Banda Singh Bahadur Engineering College, Punjab, India

Teddy Ko, Lockheed Martin, Washington, DC

Rama Krishnan, Lockheed Martin, Washington, DC

Praveen Sankaran, Old Dominion University, Norfolk, VA

Vijayan Asari, Old Dominion University, Norfolk, VA

Li Hua-ming, Northwest University, Xi'an , P.R. China

Zhou Ming-quan, Northwest University, Xi'an , P.R. China

Geng Guo-hua, Northwest University, Xi'an , P.R. China

John M. Irvine, SAIC

Charles Fenimore, National Institute of Standards and Technology

David Cannon, SAIC

John Roberts, National Institute of Standards and Technology

Steven A. Israel, SAIC

Larry Simon, SAIC

Charles Watts, Moriarty and Associates

James D. Miller, SAIC

Michelle Brennan, Moriarty and Associates

Ana Ivelisse Avil?, National Institute of Standards and Technology

Paul F. Tighe, Booz, Allen, and Hamilton

Richard J. Behrens, Mitre Corporation

James Theiler, Los Alamos National Laboratory

Neal Harvey, Los Alamos National Laboratory

Nancy A. David, Los Alamos National Laboratory

John M. Irvine, Science Applications International Corporation

Waleed A. Yousef, George Washington University

Robert F. Wagner, Center for Devices & Radiological Health, FDA

Murray H. Loew, George Washington University

S. Alirezaee, AmirKabir Univ. of Tech., Tehran, Iran; University of Windsor, Canada

H. Aghaeinia, AmirKabir Univ. of Tech., Tehran, Iran

M. Ahmadi, University of Windsor, Canada

K. Faez, AmirKabir Univ. of Tech., Tehran, Iran

Scott K. Ralph, Charles River Analytics, Cambridge, MA

John Irvine, SAIC, Burlington, MA

Mark R. Stevens, Charles River Analytics, Cambridge, MA

Magn? Snorrason, Charles River Analytics, Cambridge, MA

David Gwilt, AFRL/SNAA Wright Patterson, AFB, Dayton, OH

Ryan O'Grady, Cybernet Systems Corporation, Ann Arbor, MI

Charles J. Cohen, Cybernet Systems Corporation, Ann Arbor, MI

Glenn Beach, Cybernet Systems Corporation, Ann Arbor, MI

Gary Moody, Cybernet Systems Corporation, Ann Arbor, MI

Jean-Pierre Peters, University of Namur, Belgium

C?line Thillou, Facult? Polytechnique de Mons, Belgium

Silvio Ferreira, Facult? Polytechnique de Mons, Belgium

Li Tao, Old Dominion University, Norfolk, VA

Vijayan Asari, Old Dominion University, Norfolk, VA

Xiuwen Liu, Florida State University, Tallahassee, FL

Mi-Ae Ko, Kyungpook National University, Korea

Young-Mo Kim, Kyungpook National University, Korea

O'tega Ejofodomi, Howard University, Washington DC

Shani Ross, Howard University, Washington DC

Ahmed Jendoubi, Howard University, Washington DC

Mohamed Chouikha, Howard University, Washington DC

Jianchao Zeng, Howard University, Washington DC

S. Alirezaee, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran; University of Windsor, Canada

H. Aghaeinia, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran

M. Ahmadi, University of Windsor, Canada

K. Faez, Amirkabir Univ. of Tech., & Iran Telecommunication Research Center, Tehran, Iran

Orlando J. Hernandez, The College of New Jersey, Ewing

Alireza Khotanzad, Southern Methodist University, Dallas, Texas

Jamie Price, Naval Research Laboratory, Washington DC

Carlos Maraviglia, Naval Research Laboratory, Washington DC

William Seisler, Naval Research Laboratory, Washington DC

Elmer Williams, Naval Research Laboratory, Washington DC

Myron Pauli, Naval Research Laboratory, Washington DC