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29th Applied Imagery Pattern Recognition Workshop (AIPR'00)
Washington, D.C.
October 16-October 18
ISBN: 0-7695-0978-9
Table of Contents
Preface (PDF)
pp. viii
Session 1: Historical Perspectives of Remote Sensing, Chair: David Schaefer, George Mason University
Charles J. Cohen, Vice President of Research & Development, Cybernet Systems Corporation
pp. 3
Session 2: Satellite and Aerial Image Classification, Chair: John Schott, Rochester Institute of Technology
M. Smit, NASA/GSFC, Greenbelt, Maryland
J. Garegnani, NASA/GSFC, Greenbelt, Maryland
M. Bechdol, NASA/GSFC, Greenbelt, Maryland
S. Chettri, NASA/GSFC, Greenbelt, Maryland
pp. 39
Glenn Becker, CTO, Magnify Research, Inc., Glen Burnie, Maryland
Peter Bock, The George Washington University, Washington, DC
pp. 47
Session 3: Image Storage and Retrieval, Chair: Peter Costianes, AFRL, Rome Research Site
Peter J. Costianes, Air Force Research Laboratory
Edward Daniszewski, Air Force Research Laboratory
Fred Haritatos, Air Force Research Laboratory
pp. 57
Sergei S. Orlov, Stanford University, Stanford, CA
William Phillips, Stanford University, Stanford, CA
Eric Bjornson, Stanford University, Stanford, CA
Lambertus Hesselink, Stanford University, Stanford, CA
pp. 71
Xiaochun Li, Stanford University
Fedor Dimov, Stanford University
William Phillips, Stanford University
Lambertus Hesselink, Stanford University
Robert McLeod, Siros Technologies, San Jose, CA
pp. 78
L. Fang, School of EEE, Nanyang Technological University, Singapore 639798
A. Hock, School of EEE, Nanyang Technological University, Singapore 639798
pp. 85
Session 4: Image Compression and Coding, Chair: Bob Bonneau, AFRL, Rome Research Site
Yiwei Wang, The Pennsylvania State University
John F. Doherty, The Pennsylvania State University
Robert E. Van Dyck, National Institute of Standards and Technology
pp. 95
B. Eckstein, Science Applications International Corporation
J. Irvine, Science Applications International Corporation
R. Hummel, Defense Advanced Research Projects Agency ISO
R. Peters, Science Applications International Corporation
R. Ritzel, Science Applications International Corporation
pp. 102
John M. Heermans, Lockheed Martin Management and Data Systems - Reconnaissance Systems, Arizona
Roger Rouse, Lockheed Martin Management and Data Systems - Reconnaissance Systems, Arizona
Chung-Fu Chang, Lockheed Martin Management and Data Systems - Reconnaissance Systems, Arizona
Robert Bonneau, AFRL/SNRT, Rome, New York
pp. 121
Anthony Hoogs, GE Corporate Research and Development, Niskayuna, New York
Joseph Mundy, GE Corporate Research and Development, Niskayuna, New York
pp. 129
Mohamed-Chaker Larabi, IRCOM-SIC Laboratory, Poitiers University
Noël Richard, IRCOM-SIC Laboratory, Poitiers University
Christine fernandez, IRCOM-SIC Laboratory, Poitiers University
pp. 136
Robert Li, N.C. A&T State University, Greensboro, N.C
Jung Kim, N.C. A&T State University, Greensboro, N.C
pp. 141
Reiko Osada, Graduate School of Engineering, University of Tokyo, Tokyo, Japan
Terumasa Aoki, Graduate School of Engineering, University of Tokyo, Tokyo, Japan
Hiroshi Yasuda, Graduate School of Engineering, University of Tokyo, Tokyo, Japan
pp. 146
Session 5: Medical Imaging, Chairs: Laurence Clarke, NCI and Gil Devey, NSF
R. Mah, NASA Ames Research Center, Moffett Field, CA
A. Aghevli, NASA Ames Research Center, Moffett Field, CA
K. Freitas, NASA Ames Research Center, Moffett Field, CA
M. Guerrero, NASA Ames Research Center, Moffett Field, CA
R. Papasin, NASA Ames Research Center, Moffett Field, CA
C. Reed, NASA Ames Research Center, Moffett Field, CA
R. Andrews, NASA Ames Research Center, Moffett Field, CA
S. Jeffrey, NASA Ames Research Center, Moffett Field, CA
pp. 153
Paul Sajda, Columbia University New York, NY
Clay Spence, Sarnoff Corporation Princeton, NJ
Lucas Parra, Sarnoff Corporation Princeton, NJ
Robert Nishikawa, The University of Chicago, Chicago, IL
pp. 159
Robert P. Velthuizen, Dept of Radiology, University of South Florida and the H. Lee Moffitt Cancer Center and Research Institute, Tampa, FL
pp. 166
Scott Lindell, Lockheed Martin Astronautics, Denver, Colorado
Gary Shapiro, Lockheed Martin Astronautics, Denver, Colorado
Kenneth Weil, MedDetect LLC, Denver, Colorado
David Flannery, MedDetect LLC, Denver, Colorado
Jeffrey Levy, MedDetect LLC, Denver, Colorado
Wei Qian, U. South Florida, Tampa, Florida
pp. 173
Kelvin Woods, Department of EECS, The Catholic University of America, Washington D.C.
Yue Wang, Department of EECS, The Catholic University of America, Washington D.C.
Li Fan, Department of EE, University of Missouri-Columbia
Chag Wen Chen, Department of EE, University of Missouri-Columbia
pp. 180
Frederic L. Lizzi, Riverside Research Institute, New York, NY
Ernest J. Feleppa, Riverside Research Institute, New York, NY
pp. 187
Murray H. Loew, Institute for Medical Imaging and Image Analysis, George Washington University, Washington, DC
Rashidus Mia, Institute for Medical Imaging and Image Analysis, George Washington University, Washington, DC
Zhenyu Guo, Institute for Medical Imaging and Image Analysis, George Washington University, Washington, DC
pp. 193
Session 6: Aerial Image Registration, Chair: Bob Meyer, BAE Systems
Richard W. Cannata, Harris Corporation, GCSD, Melbourne, FL
Steven G. Blask, Harris Corporation, GCSD, Melbourne, FL
John A. Van Workum, Harris Corporation, GCSD, Melbourne, FL
Mubarak Shah, School of EECS, University of Central Florida Orlando, FL
pp. 215
Eamon B. Barrett, Lockheed Martin Space Systems, Sunnyvale, California
Paul M. Payton, Lockheed Martin Space Systems, Sunnyvale, California
pp. 223
Session 7: Image Analysis Tools, Chair: Tom Strat, DiamondBack Vision
James J. Nolan, George Mason University, Fairfax, V A 22030
Arun K. Sood, George Mason University, Fairfax, V A 22030
Robert Simon, George Mason University, Fairfax, V A 22030
pp. 252
Teddy Ko, The George Washington University, Washington DC
Peter Bock, The George Washington University, Washington DC
pp. 259
Session 8: Satellite and Aerial Image Assessment, Chair: Harvey Rhody, Rochester Institute of Technology
Robert Fiete, Eastman Kodak Company
Theodore Tantalo, Eastman Kodak Company
Jason Calus, Eastman Kodak Company
James Mooney, Eastman Kodak Company
pp. 269
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