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Third International Conference on Application of Concurrency to System Design (ACSD'03)
Specification Coverage Aided Test Selection
Guimar?es, Portugal
June 18-June 20
ISBN: 0-7695-1887-7
ASCII Text
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Tuomo Pyhälä, Keijo Heljanko, "Specification Coverage Aided Test Selection," 2010 10th International Conference on Application of Concurrency to System Design, pp. 187, Third International Conference on Application of Concurrency to System Design (ACSD'03), 2003.
 
 
BibTex
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@article{ 10.1109/CSD.2003.1207713,
author = {Tuomo Pyhälä and Keijo Heljanko},
title = {Specification Coverage Aided Test Selection},
journal ={2010 10th International Conference on Application of Concurrency to System Design},
volume = {0},
year = {2003},
isbn = {0-7695-1887-7},
pages = {187},
doi = {http://doi.ieeecomputersociety.org/10.1109/CSD.2003.1207713},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 2010 10th International Conference on Application of Concurrency to System Design
TI - Specification Coverage Aided Test Selection
SN - 0-7695-1887-7
SP
EP
A1 - Tuomo Pyhälä,
A1 - Keijo Heljanko,
PY - 2003
KW - null
VL - 0
JA - 2010 10th International Conference on Application of Concurrency to System Design
ER -
 
Tuomo Pyhälä, Helsinki University of Technology
Keijo Heljanko, Helsinki University of Technology
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.
Citation:
Tuomo Pyhälä, Keijo Heljanko, "Specification Coverage Aided Test Selection," acsd, pp.187, Third International Conference on Application of Concurrency to System Design (ACSD'03), 2003
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