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Issue No.03 - May-June (vol.31)
ISSN: 0740-7459
TABLE OF CONTENTS
Front Cover (PDF)
pp. c1
Masthead (PDF)
pp. 1
pp. 2-3
Forrest Shull , Software Engineering Institute of Carnegie Mellon University
pp. 4-8
Eoin Woods , Artechra
pp. 10-13
Mathias Meyer , Travis CI
pp. 14-16
Rahul D. Sadafule , AppZoy Technologies
pp. 17-20
Christof Ebert , Vector Consulting Services
pp. 21-24
Mutation Testing (Abstract)
Pedro Reales , University of Castilla-La Mancha
Macario Polo , University of Castilla-La Mancha
Jose Luis Fernandez-Aleman , University of Murcia
Ambrosio Toval , University of Murcia
Mario Piattini , University of Castilla-La Mancha
pp. 30-35
Ayse Basar Bener , Ryerson University
Maurizio Morisio , Politecnico di Torino
Andriy Miranskyy , Ryerson University
pp. 36-39
Birgit Penzenstadler , University of California, Irvine
Ankita Raturi , University of California, Irvine
Debra Richardson , University of California, Irvine
Bill Tomlinson , University of California, Irvine
pp. 40-47
Ricardo Perez-Castillo , University of Castilla-La Mancha
Mario Piattini , University of Castilla-La Mancha
pp. 48-54
Colin Atkinson , University of Mannheim
Thomas Schulze , University of Mannheim
Sonja Klingert , University of Mannheim
pp. 56-63
Krzysztof Sierszecki , Danfoss Power Electronics
Tommi Mikkonen , Tampere University of Technology
Michaela Steffens , Danfoss Power Electronics
Thomas Fogdal , Danfoss Power Electronics
Juha Savolainen , Danfoss Power Electronics
pp. 64-68
Chenlei Zhang , University of Alberta
Abram Hindle , University of Alberta
Daniel M. German , University of Victoria
pp. 69-75
Ayse Basar Bener , Ryerson University
Andriy Miranskyy , Ryerson University
Steve Raspudic , IBM Canada
pp. 76-78
Jon Whittle , Lancaster University
John Hutchinson , Lancaster University
Mark Rouncefield , Lancaster University
pp. 79-85
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