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| Jim Shore, "Fail Fast," IEEE Software, vol. 21, no. 5, pp. 21-25, September/October, 2004. | |||
| BibTex | x | ||
| @article{ 10.1109/MS.2004.1331296, author = {Jim Shore}, title = {Fail Fast}, journal ={IEEE Software}, volume = {21}, number = {5}, issn = {0740-7459}, year = {2004}, pages = {21-25}, doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2004.1331296}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Software TI - Fail Fast IS - 5 SN - 0740-7459 SP21 EP25 EPD - 21-25 A1 - Jim Shore, PY - 2004 KW - fail fast VL - 21 JA - IEEE Software ER - | |||
Learn about a simple technique that will dramatically reduce the number of these bugs in your software. It won't reduce the overall number of bugs, at least not at first, but it'll make most defects much easier to find.
Index Terms:
fail fast
Citation:
Jim Shore, "Fail Fast," IEEE Software, vol. 21, no. 5, pp. 21-25, Sept.-Oct. 2004, doi:10.1109/MS.2004.1331296
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