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Issue No.03 - May/June (2003 vol.20)
pp: 64-67
ABSTRACT
<p>Accelerated stress testing reduces the calendar time required to test a system, but this technique can be hard to apply to functions that run on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don?t distort the system?s operational profile.</p>
INDEX TERMS
Testing strategies, accelerated stress testing, system clock, scheduled functions, operational profile
CITATION
Vaughn T. Rokosz, "Long-Term Testing in a Short-Term World", IEEE Software, vol.20, no. 3, pp. 64-67, May/June 2003, doi:10.1109/MS.2003.1196323
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