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Issue No.05 - September (1996 vol.13)
pp: 83-88
ABSTRACT
<p>The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.</p>
CITATION
David M. Cohen, Siddhartha R. Dalal, Jesse Parelius, Gardner C. Patton, "The Combinatorial Design Approach to Automatic Test Generation", IEEE Software, vol.13, no. 5, pp. 83-88, September 1996, doi:10.1109/52.536462
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