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Issue No.04 - July-Aug. (vol.33)
ISSN: 0272-1732
TABLE OF CONTENTS
From the Editor in Chief
Erik R. Altman , Thomas J. Watson Research Center
pp. 2
Guest Editor's Introduction
Reliability-Aware Microarchitecture
Ulya R. Karpuzcu , University of Minnesota
Nam Sung Kim , University of Wisconsin-Madison
Josep Torrellas , University of Illinois at Urbana-Champaign
pp. 6-14
Hao Wang , University of Wisconsin-Madison
Nam Sung Kim , University of Wisconsin-Madison
pp. 16-24
David J. Palframan , University of Wisconsin-Madison
Nam Sung Kim , University of Wisconsin-Madison
Mikko H. Lipasti , University of Wisconsin-Madison
pp. 26-34
Veit B. Kleeberger , TU München
Christina Gimmler-Dumont , TU Kaiserslautern
Christian Weis , TU Kaiserslautern
Andreas Herkersdorf , TU München
Sani R. Nassif , IBM Research Austin
Ulf Schlichtmann , TU München
Norbert Wehn , TU Kaiserslautern
pp. 46-55
Lukasz G. Szafaryn , University of Virginia
Brett H. Meyer , McGill University
Kevin Skadron , University of Virginia
pp. 56-65
Youngtaek Kim , University of Texas at Austin
Lizy Kurian John , University of Texas at Austin
Sanjay Pant , Advanced Micro Devices
Srilatha Manne , Advanced Micro Devices
Michael Schulte , Advanced Micro Devices
W. Lloyd Bircher , Advanced Micro Devices
Madhu Saravana Sibi Govindan , Advanced Micro Devices
pp. 66-75
Micro Law
Micro Economics
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