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Bit-Error-Rate Monitoring for Active Wavelength Control of Resonant Modulators
Jan.-Feb. 2013 (vol. 33 no. 1)
pp. 42-52
William A. Zortman, Sandia National Labs
Anthony L. Lentine, Sandia National Labs
Douglas C. Trotter, Sandia National Labs
Michael R. Watts, Massachusetts Institute of Technology
A new method uses bit-error-rate measurements to acquire and stabilize the wavelength of an optical resonant modulator to an optical carrier wave. This is attractive because it uses the pertinent metric, bit error rate, to optimize the modulator resonance independent of other system variations, meaning it can compensate for system aging and drift even in the heater element itself.
Index Terms:
Modulation,Optical interconnections,Receivers,Resonators,Logic gates,Optical resonators,Resonant frequency,High performance computing,high-performance computing,optical interconnections,optical resonators
Citation:
William A. Zortman, Anthony L. Lentine, Douglas C. Trotter, Michael R. Watts, "Bit-Error-Rate Monitoring for Active Wavelength Control of Resonant Modulators," IEEE Micro, vol. 33, no. 1, pp. 42-52, Jan.-Feb. 2013, doi:10.1109/MM.2012.73
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