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Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism
May/June 2012 (vol. 32 no. 3)
pp. 79-87
ASCII Text
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Doe Hyun Yoon, Naveen Muralimanohar, Jichuan Chang, Parthasarathy Ranganathan, Norman P. Jouppi, Mattan Erez, "Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism," IEEE Micro, vol. 32, no. 3, pp. 79-87, May/June, 2012.
 
 
BibTex
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@article{ 10.1109/MM.2012.15,
author = {Doe Hyun Yoon and Naveen Muralimanohar and Jichuan Chang and Parthasarathy Ranganathan and Norman P. Jouppi and Mattan Erez},
title = {Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism},
journal ={IEEE Micro},
volume = {32},
number = {3},
issn = {0272-1732},
year = {2012},
pages = {79-87},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2012.15},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Micro
TI - Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism
IS - 3
SN - 0272-1732
SP79
EP87
EPD - 79-87
A1 - Doe Hyun Yoon,
A1 - Naveen Muralimanohar,
A1 - Jichuan Chang,
A1 - Parthasarathy Ranganathan,
A1 - Norman P. Jouppi,
A1 - Mattan Erez,
PY - 2012
KW - error correction codes
KW - nonvolatile memory
KW - phase-change random access memory
KW - reliability
KW - resistance
KW - memory
VL - 32
JA - IEEE Micro
ER -
 
Doe Hyun Yoon, Hewlett-Packard Labs
Naveen Muralimanohar, Hewlett-Packard Labs
Jichuan Chang, Hewlett-Packard Labs
Parthasarathy Ranganathan, Hewlett-Packard Labs
Norman P. Jouppi, Hewlett Packard
Mattan Erez, University of Texas at Austin
Free-p—fine-grained remapping with error checking and correcting (ECC) and embedded pointers—remaps worn-out nonvolatile RAM (NVRAM) blocks at a fine granularity without requiring large dedicated storage and protects NVRAM against both hard and soft errors. Furthermore, Free-p can be implemented purely in the memory controller, avoiding custom NVRAM devices.
Index Terms:
error correction codes, nonvolatile memory, phase-change random access memory, reliability, resistance, memory
Citation:
Doe Hyun Yoon, Naveen Muralimanohar, Jichuan Chang, Parthasarathy Ranganathan, Norman P. Jouppi, Mattan Erez, "Free-p: A Practical End-to-End Nonvolatile Memory Protection Mechanism," IEEE Micro, vol. 32, no. 3, pp. 79-87, May-June 2012, doi:10.1109/MM.2012.15
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