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Issue No.01 - January/February (2011 vol.31)
pp: 20-28
Svilen Kanev , Harvard University
Wonyoung Kim , Harvard University
Simone Campanoni , Harvard University
Michael D. Smith , Harvard University
Gu-Yeon Wei , Harvard University
Vijay Janapa Reddi , Harvard University
ABSTRACT
<p>Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.</p>
INDEX TERMS
Software thread scheduling, processor design, dI/dt, voltage margins, inductive noise
CITATION
Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu-Yeon Wei, Vijay Janapa Reddi, "Voltage Noise in Production Processors", IEEE Micro, vol.31, no. 1, pp. 20-28, January/February 2011, doi:10.1109/MM.2010.104
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