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Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity
January/February 2010 (vol. 30 no. 1)
pp. 110-110
Vijay Janapa Reddi, Harvard University
Meeta Gupta, Harvard University
Glenn Holloway, Harvard University
Michael D. Smith, Harvard University
Gu-Yeon Wei, Harvard University
David Brooks, Harvard University

Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.

Index Terms:
performance, reliability, fault-tolerance, voltage noise, dI/dt, inductive noise, voltage emergencies
Vijay Janapa Reddi, Meeta Gupta, Glenn Holloway, Michael D. Smith, Gu-Yeon Wei, David Brooks, "Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity," IEEE Micro, vol. 30, no. 1, pp. 110-110, Jan.-Feb. 2010, doi:10.1109/MM.2010.25
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