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Issue No.01 - January/February (2010 vol.30)
pp: 110
Vijay Janapa Reddi , Harvard University
Meeta Gupta , Harvard University
Glenn Holloway , Harvard University
Michael D. Smith , Harvard University
Gu-Yeon Wei , Harvard University
David Brooks , Harvard University
ABSTRACT
<p>Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.</p>
INDEX TERMS
performance, reliability, fault-tolerance, voltage noise, dI/dt, inductive noise, voltage emergencies
CITATION
Vijay Janapa Reddi, Meeta Gupta, Glenn Holloway, Michael D. Smith, Gu-Yeon Wei, David Brooks, "Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity", IEEE Micro, vol.30, no. 1, pp. 110, January/February 2010, doi:10.1109/MM.2010.25
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