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Issue No.02 - March/April (2008 vol.28)
pp: 30-38
Kevin Reick , IBM Systems & Technology Group
Pia N. Sanda , IBM Systems & Technology Group
Scott Swaney , IBM Systems & Technology Group
Jeffrey W. Kellington , IBM Systems & Technology Group
Michael Mack , IBM Systems & Technology Group
Michael Floyd , IBM Systems & Technology Group
Daniel Henderson , IBM Systems & Technology Group
ABSTRACT
The IBM Power6 microprocessor extends the capabilities of the Power5, dramatically increasing its ability to recover from hard and soft errors without increasing system downtime. The Power6 adds new mainframe-like features for enhanced reliability, availability, and serviceability, including instruction retry and processor failover. Optimized for performance and power, the Power6 implements these RAS enhancements without compromising ultrahigh-frequency operation.
INDEX TERMS
Hot Chips 19, RAS, fault tolerance, fault isolation, reliability, instruction retry
CITATION
Kevin Reick, Pia N. Sanda, Scott Swaney, Jeffrey W. Kellington, Michael Mack, Michael Floyd, Daniel Henderson, "Fault-Tolerant Design of the IBM Power6 Microprocessor", IEEE Micro, vol.28, no. 2, pp. 30-38, March/April 2008, doi:10.1109/MM.2008.22
REFERENCES
1. H.Q. Le et al., "IBM Power6 Microarchitecture," IBM J. Research and Development, vol. 51, no. 6, Nov. 2007, pp. 639-662.
2. M.J. Mack, W.M. Sauer, and B.G. Mealey, "IBM Power6 Reliability," IBM J. Research and Development, vol. 51, no. 6, Nov. 2007, pp. 763-764.
3. S. Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE Micro, vol. 25, no. 6, Nov.–Dec. 2005, pp. 10-16.
4. R.C. Baumann, "Radiation-Induced Soft Errors in Advanced Semiconductor Technologies," IEEE Trans. Device and Materials Reliability, vol. 5, no. 3, Sept. 2005, pp. 305-316.
5. J.M. Tendler et al., "Power4 System Microarchitecture," IBM J. Research and Development, vol. 46, no. 1, 2002, pp. 5-26.
6. D.C. Bossen et al., "Fault-Tolerant Design of the IBM pSeries 690 System using Power4 Processor Technology," IBM J. Research and Development, vol. 46, no. 1, 2002, pp. 77-86.
7. P.J. Meaney et al., "IBM z990 Soft Error Detection and Recovery," IEEE Trans. Device and Materials Reliability, vol. 5, no. 3, Sept. 2005, pp. 419-427.
8. P.N. Sanda et al., "Power6 Processor Soft Error Resilience," IBM J. Research and Development, vol. 51, no. 6, Nov. 2008, pp. 662-632.
9. E.W. Casio et al., "The Proton Irradiation Program at the Northeast Proton Therapy Center," Proc. IEEE Radiation Effects Data Workshop, IEEE Press, 2003, pp. 141-144.
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