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Issue No.06 - November/December (2007 vol.27)
pp: 36-45
Scott Mahlke , University of Michigan
Resit Sendag , University of Rhode Island
Derek Chiou , University of Texas at Austin
Joshua J. Yi , Freescale Semiconductor
ABSTRACT
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
INDEX TERMS
control structure reliability, testing, and fault-tolerance; control structures and microprogramming; hardware; reliability, testing, and fault-tolerance; arithmetic and logic structures; memory structures; performance and reliability
CITATION
Antonio González, Scott Mahlke, Shubu Mukherjee, Resit Sendag, Derek Chiou, Joshua J. Yi, "Reliability: Fallacy or Reality?", IEEE Micro, vol.27, no. 6, pp. 36-45, November/December 2007, doi:10.1109/MM.2007.107
REFERENCES
1. S. Borkar, "Microarchitecture and Design Challenges for Gigascale Integration," keynote address, 37th Ann. IEEE/ACM Int'l Symp. Microarchitecture, 2004.
2. National Software Testing Labs, http:/www.nstl.com.
3. R. Mariani, G. Boschi, and A. Ricca, "A System-Level Approach for Memory Robustness," Proc. Int'l Conf. Memory Technology and Design(ICMTD 05), 2005, http://www.icmtd.comproceedings.htm.
4. J. Srinivasan et al., "Lifetime Reliability: Toward an Architectural Solution," IEEE Micro, vol. 25, no. 3, May-June 2005, pp. 70-80.
5. Center for Advanced Life Cycle Engineering, Univ. of Maryland; http:/www.calce.umd.edu.
6. D. Ernst et al., "Razor: A Low-Power Pipeline Based on Circuit-Level Timing Speculation," Proc. 36th Ann. Int'l Symp. Microarchitecture (MICRO 03), IEEE CS Press, 2003, pp. 7-18.
7. S.E. Michalak et al., "Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory's ASC Q Supercomputer," IEEE Trans. Device and Materials Reliability, vol. 5, no. 3, Sept. 2005, pp. 329-335.
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