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AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants
January/February 2007 (vol. 27 no. 1)
pp. 26-35
ASCII Text
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Shan Lu, Joseph Tucek, Feng Qin, Yuanyuan Zhou, "AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants," IEEE Micro, vol. 27, no. 1, pp. 26-35, January/February, 2007.
 
 
BibTex
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@article{ 10.1109/MM.2007.5,
author = {Shan Lu and Joseph Tucek and Feng Qin and Yuanyuan Zhou},
title = {AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants},
journal ={IEEE Micro},
volume = {27},
number = {1},
issn = {0272-1732},
year = {2007},
pages = {26-35},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2007.5},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - MGZN
JO - IEEE Micro
TI - AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants
IS - 1
SN - 0272-1732
SP26
EP35
EPD - 26-35
A1 - Shan Lu,
A1 - Joseph Tucek,
A1 - Feng Qin,
A1 - Yuanyuan Zhou,
PY - 2007
KW - reliability
KW - testing
KW - debugging
KW - concurrent program
KW - atomicity violation
KW - concurrency bug
KW - bug detection
KW - hardware support
KW - program invariant
VL - 27
JA - IEEE Micro
ER -
 
Shan Lu, University of Illinois at Urbana-Champaign
Joseph Tucek, University of Illinois at Urbana-Champaign
Feng Qin, University of Illinois at Urbana-Champaign
Yuanyuan Zhou, University of Illinois at Urbana-Champaign
This article proposes an innovative concurrent-program invariant that captures programmers' atomicity assumptions. It describes a tool with two implementations, one in software and the other using hardware support, that can automatically extract such invariants and detect atomicity bugs.
Index Terms:
reliability, testing, debugging, concurrent program, atomicity violation, concurrency bug, bug detection, hardware support, program invariant
Citation:
Shan Lu, Joseph Tucek, Feng Qin, Yuanyuan Zhou, "AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants," IEEE Micro, vol. 27, no. 1, pp. 26-35, Jan.-Feb. 2007, doi:10.1109/MM.2007.5
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