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MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits
September/October 2006 (vol. 26 no. 5)
pp. 19-27
Kundan Nepal, Brown University
R. Iris Bahar, Brown University
Joseph Mundy, Brown University
William R. Patterson, Brown University
Alexander Zaslavsky, Brown University
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.
Index Terms:
Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy
Citation:
Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," IEEE Micro, vol. 26, no. 5, pp. 19-27, Sept.-Oct. 2006, doi:10.1109/MM.2006.96
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