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MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits
September/October 2006 (vol. 26 no. 5)
pp. 19-27
| ASCII Text | x | ||
| Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," IEEE Micro, vol. 26, no. 5, pp. 19-27, September/October, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MM.2006.96, author = {Kundan Nepal and R. Iris Bahar and Joseph Mundy and William R. Patterson and Alexander Zaslavsky}, title = {MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits}, journal ={IEEE Micro}, volume = {26}, number = {5}, issn = {0272-1732}, year = {2006}, pages = {19-27}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2006.96}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Micro TI - MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits IS - 5 SN - 0272-1732 SP19 EP27 EPD - 19-27 A1 - Kundan Nepal, A1 - R. Iris Bahar, A1 - Joseph Mundy, A1 - William R. Patterson, A1 - Alexander Zaslavsky, PY - 2006 KW - Reliability KW - Markov random fields KW - probabilistic computing KW - noise immunity KW - redundancy VL - 26 JA - IEEE Micro ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2006.96
Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.
Index Terms:
Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy
Citation:
Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," IEEE Micro, vol. 26, no. 5, pp. 19-27, Sept.-Oct. 2006, doi:10.1109/MM.2006.96
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