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Issue No.05 - September/October (2006 vol.26)
pp: 10-18
Egas Henes Neto , Universidade Estadual do Rio Grande do Sul
Ivandro Ribeiro , Universidade Estadual do Rio Grande do Sul
Michele Vieira , Universidade Estadual do Rio Grande do Sul
Gilson Wirth , Universidade Estadual do Rio Grande do Sul
Fernanda Lima Kastensmidt , Universidade Federal do Rio Grande do Sul
ABSTRACT
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption.
INDEX TERMS
Built-in tests, Error-checking, Reliability, Testing, and Fault-Tolerance
CITATION
Egas Henes Neto, Ivandro Ribeiro, Michele Vieira, Gilson Wirth, Fernanda Lima Kastensmidt, "Using Bulk Built-in Current Sensors to Detect Soft Errors", IEEE Micro, vol.26, no. 5, pp. 10-18, September/October 2006, doi:10.1109/MM.2006.103
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