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Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
November/December 2005 (vol. 25 no. 6)
pp. 10-16
Shekhar Borkar, Intel Corp.
As technology scales, variability will continue to become worse. Random dopantfluctuations and sub-wavelength lithography will yield static variations, supply voltageand temperature variations will affect circuit performance and leakage power, soft-errorrates will continue to rise, and transistor aging will become worse. We discuss theseeffects and propose solutions to build reliable systems with billions of unreliablecomponents.
Index Terms:
Hardware Computer System Organization
Citation:
Shekhar Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE Micro, vol. 25, no. 6, pp. 10-16, Nov.-Dec. 2005, doi:10.1109/MM.2005.110
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