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November/December 2005 (vol. 25 no. 6)
pp. 8-9
Sarita V. Adve, University of Illinois at Urbana-Champaign
Pia Sanda, IBM
This special issue of IEEE Micro addresses the trends toward reliability-aware microarchitecture, their system-level implications, and some innovative ideas on how to build systems in the face of those challenges.
Index Terms:
Reliability-aware microarchitecture, CMOS scaling, soft errors, reliability management
Citation:
Sarita V. Adve, Pia Sanda, "Guest Editors' Introduction: Reliability-Aware Microarchitecture," IEEE Micro, vol. 25, no. 6, pp. 8-9, Nov.-Dec. 2005, doi:10.1109/MM.2005.112
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