Issue No.05 - September/October (2005 vol.25)
Diana Marculescu , Carnegie Mellon University
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2005.86
The authors present microarchitecture-level statistical models for characterizing process and system parameter variability, concentrating on gate length and on-chip temperature variations. To assess the effect of microarchitecture decisions on these variations, and vice versa, they propose a joint performance, power, and variability metric that distinguishes among various design choices.
Energy awareness, gate length, on-chip temperature variations, variability metric
Diana Marculescu, "Energy Awareness and Uncertainty in Microarchitecture-Level Design", IEEE Micro, vol.25, no. 5, pp. 64-76, September/October 2005, doi:10.1109/MM.2005.86