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Energy Awareness and Uncertainty in Microarchitecture-Level Design
September/October 2005 (vol. 25 no. 5)
pp. 64-76
Diana Marculescu, Carnegie Mellon University
Emil Talpes, Carnegie Mellon University
The authors present microarchitecture-level statistical models for characterizing process and system parameter variability, concentrating on gate length and on-chip temperature variations. To assess the effect of microarchitecture decisions on these variations, and vice versa, they propose a joint performance, power, and variability metric that distinguishes among various design choices.
Index Terms:
Energy awareness, gate length, on-chip temperature variations, variability metric
Citation:
Diana Marculescu, Emil Talpes, "Energy Awareness and Uncertainty in Microarchitecture-Level Design," IEEE Micro, vol. 25, no. 5, pp. 64-76, Sept.-Oct. 2005, doi:10.1109/MM.2005.86
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