Issue No.03 - May/June (2005 vol.25)
Jayanth Srinivasan , University of Illinois, Urbana-Champaign
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2005.54
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance.
Lifetime reliability, scaling, power management, RAMP, MTTF, DRM
Sarita V. Adve, Pradip Bose, Jayanth Srinivasan, "Lifetime Reliability: Toward an Architectural Solution", IEEE Micro, vol.25, no. 3, pp. 70-80, May/June 2005, doi:10.1109/MM.2005.54