Issue No.03 - May/June (2005 vol.25)
Jayanth Srinivasan , University of Illinois, Urbana-Champaign
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2005.54
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance.
Lifetime reliability, scaling, power management, RAMP, MTTF, DRM
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers, "Lifetime Reliability: Toward an Architectural Solution", IEEE Micro, vol.25, no. 3, pp. 70-80, May/June 2005, doi:10.1109/MM.2005.54