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Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation
November/December 2004 (vol. 24 no. 6)
pp. 10-20
ASCII Text
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Dan Ernst, Shidhartha Das, Seokwoo Lee, David Blaauw, Todd Austin, Trevor Mudge, Nam Sung Kim, Kriszti? Flautner, "Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation," IEEE Micro, vol. 24, no. 6, pp. 10-20, November/December, 2004.
 
 
BibTex
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@article{ 10.1109/MM.2004.85,
author = {Dan Ernst and Shidhartha Das and Seokwoo Lee and David Blaauw and Todd Austin and Trevor Mudge and Nam Sung Kim and Kriszti? Flautner},
title = {Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation},
journal ={IEEE Micro},
volume = {24},
number = {6},
issn = {0272-1732},
year = {2004},
pages = {10-20},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2004.85},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Micro
TI - Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation
IS - 6
SN - 0272-1732
SP10
EP20
EPD - 10-20
A1 - Dan Ernst,
A1 - Shidhartha Das,
A1 - Seokwoo Lee,
A1 - David Blaauw,
A1 - Todd Austin,
A1 - Trevor Mudge,
A1 - Nam Sung Kim,
A1 - Kriszti? Flautner,
PY - 2004
VL - 24
JA - IEEE Micro
ER -
 
Dan Ernst, University of Michigan
Shidhartha Das, University of Michigan
Seokwoo Lee, University of Michigan
David Blaauw, University of Michigan
Todd Austin, University of Michigan
Trevor Mudge, University of Michigan
Nam Sung Kim, Intel Corp.
Kriszti? Flautner, ARM Limited
Dynamic voltage scaling is one of the more effective and widely used methods for power-aware computing. Here is a dvs approach that uses dynamic detection and correction of circuit timing errors to tune processor supply voltage and eliminate the need for voltage margins.
Citation:
Dan Ernst, Shidhartha Das, Seokwoo Lee, David Blaauw, Todd Austin, Trevor Mudge, Nam Sung Kim, Kriszti? Flautner, "Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation," IEEE Micro, vol. 24, no. 6, pp. 10-20, Nov.-Dec. 2004, doi:10.1109/MM.2004.85
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