The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.04 - July/August (2003 vol.23)
pp: 14-19
ABSTRACT
<p>Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them. </p>
CITATION
Cristian Constantinescu, "Trends and Challenges in VLSI Circuit Reliability", IEEE Micro, vol.23, no. 4, pp. 14-19, July/August 2003, doi:10.1109/MM.2003.1225959
6 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool