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Trends and Challenges in VLSI Circuit Reliability
July/August 2003 (vol. 23 no. 4)
pp. 14-19

Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.

Citation:
Cristian Constantinescu, "Trends and Challenges in VLSI Circuit Reliability," IEEE Micro, vol. 23, no. 4, pp. 14-19, July-Aug. 2003, doi:10.1109/MM.2003.1225959
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