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Issue No.03 - May/June (2003 vol.23)
pp: 58-67
Denis Flandre , Universit? catholique de Louvain
Amaury N?ve , Universit? catholique de Louvain
<p>Chips based on silicon-on-insulator technology meet the tough performance and security requirements presented by smart cards. A test chip manufactured in a fully depleted SOI process incorporates a charge pump and random-number generator, critical smart-card circuit blocks.</p>
Denis Flandre, Amaury N?ve, "SOI Technology for Future High-Performance Smart Cards", IEEE Micro, vol.23, no. 3, pp. 58-67, May/June 2003, doi:10.1109/MM.2003.1209467
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