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SOI Technology for Future High-Performance Smart Cards
May/June 2003 (vol. 23 no. 3)
pp. 58-67
Amaury N?ve, Universit? catholique de Louvain
Denis Flandre, Universit? catholique de Louvain
Jean-Jacques Quisquater, Universit? catholique de Louvain

Chips based on silicon-on-insulator technology meet the tough performance and security requirements presented by smart cards. A test chip manufactured in a fully depleted SOI process incorporates a charge pump and random-number generator, critical smart-card circuit blocks.

Citation:
Amaury N?ve, Denis Flandre, Jean-Jacques Quisquater, "SOI Technology for Future High-Performance Smart Cards," IEEE Micro, vol. 23, no. 3, pp. 58-67, May-June 2003, doi:10.1109/MM.2003.1209467
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