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Fault Detection in a Tristate System Environment
September/October 2001 (vol. 21 no. 5)
pp. 77-85
Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size.
Citation:
Wenyi Feng, Farzin Karimi, Fabrizio Lombardi, "Fault Detection in a Tristate System Environment," IEEE Micro, vol. 21, no. 5, pp. 77-85, Sept.-Oct. 2001, doi:10.1109/40.958701
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