The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.05 - September/October (2001 vol.21)
pp: 77-85
ABSTRACT
Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size.
CITATION
Wenyi Feng, Farzin Karimi, Fabrizio Lombardi, "Fault Detection in a Tristate System Environment", IEEE Micro, vol.21, no. 5, pp. 77-85, September/October 2001, doi:10.1109/40.958701
14 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool