This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms
February 1994 (vol. 14 no. 1)
pp. 8-11, 13-23

Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.

Citation:
Johan Karlsson, Peter Liden, Peter Dahlgren, Rolf Johansson, Ulf Gunneflo, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms," IEEE Micro, vol. 14, no. 1, pp. 8-11, 13-23, Feb. 1994, doi:10.1109/40.259894
Usage of this product signifies your acceptance of the Terms of Use.