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Structured Design for Testability in Semicustom VLSI
January/February 1986 (vol. 6 no. 1)
pp. 51-58
James Aylor, University of Virginia
Barry Johnson, University of Virginia
Bruce Rector, Burroughs Corporation
Citation:
James Aylor, Barry Johnson, Bruce Rector, "Structured Design for Testability in Semicustom VLSI," IEEE Micro, vol. 6, no. 1, pp. 51-58, Jan.-Feb. 1986, doi:10.1109/MM.1986.304637
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