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Issue No.01 - January/February (1986 vol.6)
pp: 51-58
James Aylor , University of Virginia
Barry Johnson , University of Virginia
Bruce Rector , Burroughs Corporation
INDEX TERMS
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CITATION
James Aylor, Barry Johnson, Bruce Rector, "Structured Design for Testability in Semicustom VLSI", IEEE Micro, vol.6, no. 1, pp. 51-58, January/February 1986, doi:10.1109/MM.1986.304637
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