The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.01 - January/February (1983 vol.3)
pp: 34-51
M. Abadir , University of Saskatchewan
H. Reghbati , University of Saskatchewan
ABSTRACT
Tests good for SSI and MSI circuits can't cope with the complexity of LSI. New techniques for test generation and response evaluation are required.
INDEX TERMS
null
CITATION
M. Abadir, H. Reghbati, "LSI Testing Techniques", IEEE Micro, vol.3, no. 1, pp. 34-51, January/February 1983, doi:10.1109/MM.1983.291070
25 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool