Issue No.01 - January/February (1983 vol.3)
M. Abadir , University of Saskatchewan
Tests good for SSI and MSI circuits can't cope with the complexity of LSI. New techniques for test generation and response evaluation are required.
M. Abadir, "LSI Testing Techniques", IEEE Micro, vol.3, no. 1, pp. 34-51, January/February 1983, doi:10.1109/MM.1983.291070