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Exploratory testing as a source of testing technical debt
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ISSN: 1520-9202
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Syed Shah, Marco Torchiano, Antonio Vetro', Maurizio Morisio, "Exploratory testing as a source of testing technical debt," IT Professional, vol. 99, no. 1, pp. 1, , 5555.
 
 
BibTex
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@article{ 10.1109/MITP.2013.21,
author = {Syed Shah and Marco Torchiano and Antonio Vetro' and Maurizio Morisio},
title = {Exploratory testing as a source of testing technical debt},
journal ={IT Professional},
volume = {99},
number = {1},
issn = {1520-9202},
year = {5555},
pages = {1},
doi = {http://doi.ieeecomputersociety.org/10.1109/MITP.2013.21},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - MGZN
JO - IT Professional
TI - Exploratory testing as a source of testing technical debt
IS - 1
SN - 1520-9202
SP
EP
EPD - 1
A1 - Syed Shah,
A1 - Marco Torchiano,
A1 - Antonio Vetro',
A1 - Maurizio Morisio,
PY - 5555
VL - 99
JA - IT Professional
ER -
 
Syed Shah, Politecnico Di Torino, Torino
Marco Torchiano, Politecnico Di Torino, Torino
Antonio Vetro', Politecnico Di Torino Fraunhofer Center For Experimental Software Engineering, Torino College Park
Maurizio Morisio, Politecnico Di Torino , Torino
We analyzed the software testing approach “Exploratory Testing (ET)” through a systematic review of literature to understand the consequences of ET as Technical debt. The evidence shows that ET is used as an alternative to any structured software testing approach to speed up the testing tasks and proved to be cost effective at the time of testing. Nevertheless ET also has many weaknesses that are not apparent at the time of testing but prompt up in later phases of system life cycle. Theses weaknesses incur increased rework and cost, and hence are considered to be the sources of TD. In addition we propose the possible solutions to embark upon these weaknesses that indeed help to reduce the testing technical debt of ET.
Citation:
Syed Shah, Marco Torchiano, Antonio Vetro', Maurizio Morisio, "Exploratory testing as a source of testing technical debt," IT Professional, 08 March 2013. IEEE computer Society Digital Library. IEEE Computer Society, <http://doi.ieeecomputersociety.org/10.1109/MITP.2013.21>
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