This Article 
 Bibliographic References 
 Add to: 
AI and Global Science and Technology Assessment
July/August 2009 (vol. 24 no. 4)
pp. 68-88
Hsinchun Chen, University of Arizona
Ronald N. Kostoff, Mitre Corporation
Chaomei Chen, Drexel University
Jian Zhang, Drexel University
Michael S. Vogeley, Drexel University
Katy Börner, Indiana University
Nianli Ma, Indiana University
Russell J. Duhon, Indiana University
Angela Zoss, Indiana University
Venkat Srinivasan, Virginia Polytechnic Institute & State University
Edward A. Fox, Virginia Polytechnic Institute & State University
Christopher C. Yang, Drexel University
Chih-Ping Wei, National Tsing Hua University
Strength in science & technology (S&T) is the foundation of a nation's economic power, so an effective, automated means of continually assessing this strength is critical to understanding a country's economic status. Six essays on global S&T assessment present various research frameworks, computational methods, issues, and results relative to knowledge mapping, scientometrics, information visualization, digital libraries, and multilingual knowledge management.

1. H. Chen and M. Roco, Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis, Springer, 2009.
2. Li et al., "A Longitudinal Analysis of Nanotechnology Literature: 1976–2004," J. Nanoparticle Research, vol. 10, suppl. 1, Dec. 2008, pp. 3–22.

Index Terms:
Artificial intelligence, research, social issues
Hsinchun Chen, Ronald N. Kostoff, Chaomei Chen, Jian Zhang, Michael S. Vogeley, Katy Börner, Nianli Ma, Russell J. Duhon, Angela Zoss, Venkat Srinivasan, Edward A. Fox, Christopher C. Yang, Chih-Ping Wei, "AI and Global Science and Technology Assessment," IEEE Intelligent Systems, vol. 24, no. 4, pp. 68-88, July-Aug. 2009, doi:10.1109/MIS.2009.68
Usage of this product signifies your acceptance of the Terms of Use.