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IEEE Intelligent Systems
August 1992 (vol. 7 no. 4)
ISSN: 0885-9000
Table of Contents
Out of the Lab
Forum
Cover Story
Knowledge-Based Diagnosis in Process Engineering
Special Features
Machine Learning
News
News (Abstract)
pp. 76-78
Conferences
Conferences (Abstract)
pp. 79-82
Product Reviews
New Products
New Products (Abstract)
pp. 86-88
Book Reviews
New Books
New Books (Abstract)
pp. 91
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