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Issue No.06 - December (1991 vol.6)
pp: 38-43
ABSTRACT
<p>A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.</p>
CITATION
Hwee Tou Ng, "Model-Based, Multiple-Fault Diagnosis of Dynamic, Continuous Physical Devices", IEEE Intelligent Systems, vol.6, no. 6, pp. 38-43, December 1991, doi:10.1109/64.108950
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